Inventor
Wen Ning
Inventor
Beijing, CN
Overview
Patents· 20 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H01Lprimary
H01LSemiconductor devices20%
H10KOrganic electric solid-state devices20%
B82YSpecific uses or applications of nanostructures11%
Y02EReduction of greenhouse gas [ghg] emissions, related to energy generation, transmission or distribution8%
H04NPictorial communication, e.g. television6%
B29CShaping or joining of plastics5%
C08JWorking-up5%
C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients5%
Y02PClimate change mitigation technologies in the production or processing of goods5%
B29KIndexing scheme associated with subclasses b29b, b29c or b29d, relating to moulding materials or to materials for moulds, reinforcements, fillers or preformed parts, e.g. inserts3%
PatentTitleYear
11,121,341Organic light emitting diode including electron transport layer including carbon nanotubes202111,114,635Method for making polymer solar cell202111,040,468Method for making carbon nanotube composite structure202110,879,478Polymer solar cell202010,784,454Method for making polymer solar cell202010,777,761Polymer solar cell202010,717,213Method for carbon nanotube composite structure202010,454,032Method for making organic light emitting diode201910,385,173Method for making carbon nanotube composite structure201910,374,158Method for making organic light emitting diode201910,374,182Method for making polymer solar cell201910,319,932Method for making organic light emitting diode201910,312,465Method for making organic light emitting diode201910,305,060Organic light emitting diode having a carbon nanotube composite structure as an electron transport layer201910,305,061Organic light emitting diode201910,186,663Method for making organic light emitting diode20198,810,696'Blemish detection method'20148,717,465'Blemish detection sytem and method'20148,606,030'Image correction device and method'20138,294,771'Image correction device and image correction method thereof'2012Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2012–2021Patents assigned to HON HAI PREC IND CO LTD (20)· patent assignee history
2012–2014Patents assigned to Ning wen-min (3)· patent assignee history
2012–2014Based in Taipei, TW· patent location history
2014Based in New Taipei, TW· patent location history
2019–2021Patents assigned to UNIV TSINGHUA (16)· patent assignee history
2019–2021Based in Beijing, CN· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| HON HAI PREC IND CO LTD | 20 | 2012–2021 |
| UNIV TSINGHUA | 16 | 2019–2021 |
| Ning wen-minself | 3 | 2012–2014 |
Locations
| Location | Patents | Span |
|---|---|---|
| Beijing, CN | 16 | 2019–2021 |
| Taipei, TW | 3 | 2012–2014 |
| New Taipei, TW | 1 | 2014 |