LexDanaLexDanabeta
Inventor

Sibina Sukman

Inventor
München, DE

Overview

2→
Patents
2005
Patent span
Physics
Primary field (CPC G)

Patents· 2 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G11Cprimary
G11CStatic stores40%
G01RMeasuring electric variables20%
H10BElectronic memory devices20%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1020%
PatentTitleYear
6,917,208'Method and test structure for determining resistances at a plurality of interconnected resistors in an integrated circuit'20056,856,562'Test structure for measuring a junction resistance in a DRAM memory cell array'2005

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2005Patents assigned to INFINEON TECHNOLOGIES AG (2)· patent assignee history
2005Based in München, DE· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
INFINEON TECHNOLOGIES AG22005
Locations
LocationPatentsSpan
München, DE22005