Inventor
Takahiro Urano
Inventor
Tokyo, JP
Overview
Patents· 9 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties36%
G06TImage data processing or generation, in general20%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1016%
H01LSemiconductor devices12%
G05BControl or regulating systems in general8%
Y02PClimate change mitigation technologies in the production or processing of goods8%
PatentTitleYear
11,041,815Inspection information generation device, inspection information generation method, and defect inspection device202110,861,145Defect inspection device and defect inspection method202010,816,484Flaw inspection device and flaw inspection method202010,466,181Flaw inspection device and flaw inspection method20199,865,046'Defect inspection method and defect inspection device'20189,778,206'Defect inspection device and defect inspection method'20179,075,026'Defect inspection device and defect inspection method'20158,908,172'Defect inspection device and method of inspecting defect'20148,737,718'Apparatus and method for inspecting defect'2014Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2014–2021Patents assigned to HITACHI HIGH TECH CORP (9)· patent assignee history
2014–2015Patents assigned to URANO TAKAHIRO (3)· patent assignee history
2014–2015Patents assigned to HONDA TOSHIFUMI (2)· patent assignee history
2014–2015Patents assigned to SAKAI KAORU (2)· patent assignee history
2014–2015Based in Ebina, JP· patent location history
2017–2021Based in Tokyo, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| HITACHI HIGH TECH CORP | 9 | 2014–2021 |
| URANO TAKAHIROself | 3 | 2014–2015 |
| HONDA TOSHIFUMI | 2 | 2014–2015 |
| SAKAI KAORU | 2 | 2014–2015 |
Locations
| Location | Patents | Span |
|---|---|---|
| Tokyo, JP | 6 | 2017–2021 |
| Ebina, JP | 3 | 2014–2015 |