Inventor
Joseph M. Lukaitis
Inventor
Pleasant Valley, NY, US
Overview
Patents· 18 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H10Dprimary
H10DInorganic electric semiconductor devices31%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h1031%
H01LSemiconductor devices9%
G01RMeasuring electric variables6%
G11CStatic stores6%
G01NInvestigating or analysing materials by determining their chemical or physical properties3%
G06FElectric digital data processing3%
H02HEmergency protective circuit arrangements3%
H03KPulse technique3%
H10BElectronic memory devices3%
PatentTitleYear
10,985,156Electrostatic discharge clamp with reduced off-state power consumption20219,940,986Electrostatic discharge protection structures for eFuses20189,568,538'Matching of bipolar transistor pair through electrical stress'20179,530,798'High performance heat shields with reduced capacitance'20169,318,217'Programming an electrical fuse with a silicon-controlled rectifier'20168,765,568'Method of fabricating thermally controlled refractory metal resistor'20148,652,922'Compact thermally controlled thin film resistors utilizing substrate contacts and methods of manufacture'20148,592,947'Thermally controlled refractory metal resistor'20138,541,864'Compact thermally controlled thin film resistors utilizing substrate contacts and methods of manufacture'20138,530,319'Vertical silicide e-fuse'20138,486,796'Thin film resistors and methods of manufacture'20138,378,447'Electrically programmable fuse and fabrication method'20138,298,904'Compact thermally controlled thin film resistors utilizing substrate contacts and methods of manufacture'20128,053,870'Semiconductor structure incorporating multiple nitride layers to improve thermal dissipation away from a device and a method of forming the structure'20118,003,474'Electrically programmable fuse and fabrication method'20116,958,621'Method and circuit for element wearout recovery'20056,521,493'Semiconductor device with STI sidewall implant'20035,424,634'Non-destructive flex testing method and means'1995Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1995–2017Patents assigned to IBM (14)· patent assignee history
1995–2021Based in Pleasant Valley, NY, US· patent location history
2012–2014Patents assigned to LUKAITIS JOSEPH M (7)· patent assignee history
2012–2014Patents assigned to ROBISON ROBERT R (5)· patent assignee history
2012–2014Patents assigned to SULLIVAN TIMOTHY D (5)· patent assignee history
2012–2014Patents assigned to SLISHER DUSTIN K (4)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| IBM | 14 | 1995–2017 |
| LUKAITIS JOSEPH Mself | 7 | 2012–2014 |
| ROBISON ROBERT R | 5 | 2012–2014 |
| SULLIVAN TIMOTHY D | 5 | 2012–2014 |
| SLISHER DUSTIN K | 4 | 2012–2014 |
Locations
| Location | Patents | Span |
|---|---|---|
| Pleasant Valley, New York, US | 18 | 1995–2021 |