Inventor
Takuji Kamada
Inventor
Kanagawa, JP
Overview
Patents· 2 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
B41Fprimary
B41FPrinting machines or presses25%
G06TImage data processing or generation, in general25%
H04NPictorial communication, e.g. television25%
H10DInorganic electric semiconductor devices25%
PatentTitleYear
10,981,376Inspection apparatus, image reading apparatus, image forming apparatus, inspection method, and recording medium20216,744,037'METHOD FOR MEASURING SCAN BEAM LIGHT QUANTITY DISTRIBUTION IN SCAN OPTICAL SYSTEM, MEASUREMENT APPARATUS THEREOF, MEASUREMENT EVALUATION APPARATUS THEREOF, AND IMAGE FORMATION APPARATUS USING THE MEASUREMENT EVALUATION APPARATUS'2004Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2004Patents assigned to RICOH KK (1)· patent assignee history
2004Based in Tokyo, JP· patent location history
2021Patents assigned to KAMADA Takuji (1)· patent assignee history
2021Patents assigned to RICOH CO LTD (1)· patent assignee history
2021Based in Kanagawa, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| KAMADA Takujiself | 1 | 2021 |
| RICOH CO LTD | 1 | 2021 |
| RICOH KK | 1 | 2004 |
Locations
| Location | Patents | Span |
|---|---|---|
| Kanagawa, JP | 1 | 2021 |
| Tokyo, JP | 1 | 2004 |