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Inventor

Michael Ganser

Inventor
Giessen, DE

Overview

20→
Patents
1997–2016
Patent span
Physics
Primary field (CPC G)

Patents· 20 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G02Bprimary
G02BOptical elements, systems or apparatus64%
G01NInvestigating or analysing materials by determining their chemical or physical properties12%
B23KSoldering or unsoldering4%
B82YSpecific uses or applications of nanostructures4%
G01BMeasuring length, thickness or similar linear dimensions4%
G06TImage data processing or generation, in general4%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests4%
Y10TTechnical subjects covered by former us classification4%
PatentTitleYear
9,297,992'Microscope illumination method and microscope'20168,964,287'Device for focusing a microscope objective on a sample'20158,922,885'Fluorescence microscope having an illumination device'20148,643,711'Microscope comprising a camera connection and a camera adapter'20148,395,840'Apparatus for positioning optical components in an optical device'20138,164,829'System for recording and representing images of preparations'20127,986,338'Microscope system and image production method'20117,379,238'Reflected-light microscope'20087,091,990'Method of guided blind deconvolution of microscopic images and software'20067,079,316'Microscope and microscopy method for producing overlay images'20066,975,452'Automated microscope system'20056,944,326'Video microscopy method'20056,907,798'Device for laser cutting preparations, and a microscope'20056,787,301'Method and apparatus for laser microdissection'20046,717,725'Automated microscope system'20046,653,065'Method and apparatus for laser microdissection'20036,545,765'Method and apparatus for measuring thickness of transparent films'20036,525,876'Apparatus for changing objective lenses in a microscope'20036,369,939'Illumination device for a microscope including two light sources'20025,684,627'Microscope with a multi-functional adjustment knob'1997

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1997Patents assigned to LEICA MIKROSKOPIE & SYST (1)· patent assignee history
1997–2016Based in Giessen, DE· patent location history
2002–2016Patents assigned to LEICA MICROSYSTEMS (18)· patent assignee history
2003Patents assigned to LEICA LASERTECHNIK (1)· patent assignee history
2008Based in Bergheim-Glessen, DE· patent location history
2012–2016Patents assigned to GANSER MICHAEL (5)· patent assignee history
2013–2016Patents assigned to WEISS ALBRECHT (4)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
LEICA MICROSYSTEMS182002–2016
GANSER MICHAELself52012–2016
WEISS ALBRECHT42013–2016
LEICA LASERTECHNIK12003
LEICA MIKROSKOPIE & SYST11997
Locations
LocationPatentsSpan
Giessen, DE191997–2016
Bergheim-Glessen, DE12008