Inventor
Jeanne P. Bickford
Inventor
Essex Junction, VT, US
Overview
Patents· 18 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G06Fprimary
G06FElectric digital data processing38%
G01RMeasuring electric variables22%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h109%
Y02PClimate change mitigation technologies in the production or processing of goods9%
G05BControl or regulating systems in general6%
G06QInformation and communication technology [ict] specially adapted for administrative, commercial, financial, managerial or supervisory purposes6%
H01LSemiconductor devices6%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests3%
PatentTitleYear
10,539,611Integrated circuit chip reliability qualification using a sample-specific expected fail rate202010,089,161System and method for managing semiconductor manufacturing defects20189,891,275'Integrated circuit chip reliability qualification using a sample-specific expected fail rate'20189,880,892'System and method for managing semiconductor manufacturing defects'20189,489,482'Reliability-optimized selective voltage binning'20169,354,953'System integrator and system integration method with reliability optimized integrated circuit chip selection'20169,255,962'Determining intra-die variation of an integrated circuit'20169,058,250'In-situ computing system failure avoidance'20158,966,431'Semiconductor timing improvement'20158,949,767'Reliability evaluation and system fail warning methods using on chip parametric monitors'20158,943,444'Semiconductor device reliability model and methodologies for use thereof'20158,726,201'Method and system to predict a number of electromigration critical elements'20148,694,936'Terminal metal connection inspection'20148,504,975'Reliability evaluation and system fail warning methods using on chip parametric monitors'20137,803,644'Across reticle variation modeling and related reticle'20107,386,549'Integration of business process and use of fields in a master database'20086,850,904'Relational database for producing bill-of-materials from planning information'20056,819,967'Relational database for producing bill-of-materials from planning information'2004Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2004–2020Patents assigned to IBM (15)· patent assignee history
2004–2020Based in Essex Junction, VT, US· patent location history
2013–2014Patents assigned to BICKFORD JEANNE P (2)· patent assignee history
2013–2015Patents assigned to MENTOR GRAPHICS CORP (2)· patent assignee history
2013Patents assigned to GOSS JOHN R (1)· patent assignee history
2015Based in Essex, VT, US· patent location history
2016Patents assigned to GLOBALFOUNDRIES INC (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| IBM | 15 | 2004–2020 |
| BICKFORD JEANNE Pself | 2 | 2013–2014 |
| MENTOR GRAPHICS CORP | 2 | 2013–2015 |
| GLOBALFOUNDRIES INC | 1 | 2016 |
| GOSS JOHN R | 1 | 2013 |
Locations
| Location | Patents | Span |
|---|---|---|
| Essex Junction, VT, US | 17 | 2004–2020 |
| Essex, VT, US | 1 | 2015 |