Inventor

Gilad Barak

Inventor

Rehovot, IL

Overview

25→

Patents

2003–2021

Patent span

Physics

Primary field (CPC G)

Patents· 25 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Nprimary

G01NInvestigating or analysing materials by determining their chemical or physical properties22%

G01BMeasuring length, thickness or similar linear dimensions19%

G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices11%

H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1011%

H01LSemiconductor devices10%

G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light3%

G01LMeasuring force, stress, torque, work, mechanical power, mechanical efficiency, or fluid pressure3%

G02BOptical elements, systems or apparatus3%

A61BDiagnosis2%

A61CDentistry2%

PatentTitleYear

11,099,142X-ray based measurements in patterned structure2021 10,976,567Reduced height penalty for folded camera2021 10,876,959Method and system for optical characterization of patterned samples2020 10,761,036Method and system for optical metrology in patterned structures2020 10,732,116Hybrid metrology method and system2020 10,663,408Optical phase measurement system and method2020 10,564,106Raman spectroscopy based measurements in patterned structures2020 10,365,163Optical critical dimension metrology2019 10,365,231Optical phase measurement method and system2019 10,359,369Metrology test structure design and measurement scheme for measuring in patterned structures2019 10,311,198Overlay design optimization2019 10,274,435Method and system for optical metrology in patterned structures2019 10,216,098Test structure for use in metrology measurements of patterns2019 10,209,206Method and system for determining strain distribution in a sample2019 10,161,885Optical phase measurement method and system2018 10,073,045Optical method and system for measuring isolated features of a structure2018 10,054,423Optical method and system for critical dimensions and thickness characterization2018 10,041,838Optical critical dimension metrology2018 10,018,574Optical method and system for defects detection in three-dimensional structures2018 9,897,553'Optical phase measurement method and system'2018 9,651,498'Optical method and system for detecting defects in three-dimensional structures'2017 9,140,544'Optical system and method for measuring in patterned structures'2015 8,848,185'Optical system and method for measuring in three-dimensional structures'2014 6,583,630'Systems and methods for monitoring wear and/or displacement of artificial joint members, vertebrae, segments of fractured bones and dental implants'2003 6,573,706'Method and apparatus for distance based detection of wear and the like in joints'2003

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2003Patents assigned to INTELLIJOINT SYSTEMS LTD (2)· patent assignee history

2003Based in Kfar Hanagid, IL· patent location history

2014–2021Patents assigned to NOVA MEASURING INSTR LTD (22)· patent assignee history

2014–2015Patents assigned to BARAK GILAD (2)· patent assignee history

2014–2015Patents assigned to BRILL BOAZ (2)· patent assignee history

2014–2021Based in Rehovot, IL· patent location history

2021Patents assigned to COREPHOTONICS LTD (1)· patent assignee history

2021Based in Tel Aviv, IL· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees

Assignee	Patents	Span
NOVA MEASURING INSTR LTD	22	2014–2021
BARAK GILADself	2	2014–2015
BRILL BOAZ	2	2014–2015
INTELLIJOINT SYSTEMS LTD	2	2003
COREPHOTONICS LTD	1	2021

Locations

Location	Patents	Span
Rehovot, IL	22	2014–2021
Kfar Hanagid, IL	2	2003
Tel Aviv, IL	1	2021