Inventor
YUHEI SAKAGUCHI
Inventor
JP
Overview
Patents· 6 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties67%
G01DMeasuring not specially adapted for a specific variable11%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light11%
G01LMeasuring force, stress, torque, work, mechanical power, mechanical efficiency, or fluid pressure11%
PatentTitleYear
12,467,856Gas analysis device and gas analysis method202512,429,420Gas analysis apparatus and gas analysis method202512,332,175Optical measurement cell, optical analyzer, window forming member, and method of manufacturing optical measurement cell202511,796,460Absorbance analysis apparatus for DCR gas, absorbance analysis method for DCR gas, and absorbance analysis program recording medium on which program for DCR gas is recorded202311,493,443Light absorbance analysis apparatus and program record medium for recording programs of light absorbance analysis apparatus202211,226,235Absorption spectroscopic system, program recording medium for an absorption spectroscopic system and absorbance measurement method2022Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2022–2025Patents assigned to HORIBA STEC CO LTD (6)· patent assignee history
2022–2025Based in JP· patent location history
2023Patents assigned to TOKYO ELECTRON LTD (1)· patent assignee history
2025Patents assigned to HORIBA LTD (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| HORIBA STEC CO LTD | 6 | 2022–2025 |
| HORIBA LTD | 1 | 2025 |
| TOKYO ELECTRON LTD | 1 | 2023 |
Locations
| Location | Patents | Span |
|---|---|---|
| JP | 6 | 2022–2025 |