Inventor

Lin Zhou

Inventor
Lagrangeville, NY, US

Overview

63→
Patents
1992–2020
Patent span
Physics
Primary field (CPC G)

Patents· 63 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G11Bprimary
G11BInformation storage based on relative movement between record carrier and transducer12%
G05BControl or regulating systems in general8%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h108%
G01BMeasuring length, thickness or similar linear dimensions7%
G01QScanning-probe techniques or apparatus7%
B82YSpecific uses or applications of nanostructures6%
G01NInvestigating or analysing materials by determining their chemical or physical properties6%
A61NElectrotherapy4%
Y10TTechnical subjects covered by former us classification4%
H04WWireless communication networks4%
PatentTitleYear
10,826,450Hybrid concurrent and switched dual-band low noise amplifier202010,780,271System and method for perceiving smell remotely202010,777,414Methods for reducing transfer pattern defects in a semiconductor device2020D0885980Automobile2020D0871261Automobile201910,453,684Method for patterning a material layer with desired dimensions201910,386,289Method and system for determining features of objects in a suspension201910,264,504Method and device for user equipment scheduling201910,126,326Atomic force microscopy of scanning and image processing20189,792,940'High sample rate dPES to improve contact detection signal to noise ratio'20179,756,552'Reducing distractions caused by user devices in group settings'20179,548,072'Concurrent modulation and frictional heating head disk contact detection'20179,527,732'Methods and devices for correcting errors in atomic force microscopy'20169,349,661'Wafer thinning endpoint detection for TSV technology'20169,258,157'Method and system for mapping bit sequences'20169,202,495'Method and apparatus for detecting proximity contact between a transducer and a medium'20159,171,581'Friction force measurement assembly and method'20159,150,415'Atomic force microscopy of scanning and image processing'20159,135,938'Contact detection'20159,123,371'Methods and devices for head-media contact detection'20159,067,323'Device used for capturing micro-particles and a micro-particles transporting equipment provided with the device thereof'20159,047,898'Head-medium contact detection using introduced heat oscillation'20158,736,275'Alignment correction system and method of use'20148,730,611'Contact detection'20148,680,871'Alignment correction system and method of use'20148,638,349'Head-medium contact detection using introduced heat oscillation'20148,594,006'Setting up a multicast group communication session within a wireless communications system'20138,553,350'Tribological monitoring of a data storage device'20138,525,112'Variable pixel density imaging'20138,451,008'Alignment correction system and method of use'20138,411,270'Monitoring stage alignment and related stage and calibration target'20138,371,155'Scanning probe microscopy employing correlation pattern recognition'20138,296,860'Atomic force microscopy true shape measurement method'20128,080,849'Characterizing films using optical filter pseudo substrate'20117,831,395'Quantification of adsorbed molecular contaminant using thin film measurement'20107,808,657'Wafer and stage alignment using photonic devices'20107,742,160'Determining angle of incidence with respect to workpiece'20107,716,009'Metrology tool recipe validator using best known methods'20107,646,491'Determining azimuth angle of incident beam to wafer'20107,592,817'Alignment correction system and method of use'20097,569,112'Scanning probe apparatus with in-situ measurement probe tip cleaning capability'20097,567,179'Configuration management system and method for use in an RFID system including a multiplicity of RFID readers'20097,542,136'Flipping stage arrangement for reduced wafer contamination cross section and improved measurement accuracy and throughput'20097,535,349'Determining root cause for alarm in processing system'20097,532,867'Transceiver architecture for supporting multi-band RF'20097,485,859'Charged beam apparatus and method that provide charged beam aerial dimensional map'20097,479,396'Structure, system and method for dimensionally unstable layer dimension measurement'20097,477,365'Optical spot geometric parameter determination using calibration targets'20097,406,860'Atomic force microscopy scanning and image processing'20087,397,252'Measurement of critical dimension and quantification of electron beam size at real time using electron beam induced current'20087,369,947'Quantification of adsorbed molecular contaminant using thin film measurement'20087,325,294'Method of making electromagnetic wave shielded write and read wires on a support for a magnetic media drive'20087,305,320'Metrology tool recipe validator using best known methods'20077,187,993'Metrology tool error log analysis methodology and system'20077,065,425'Metrology tool error log analysis methodology and system'20066,839,202'Electromagnetic wave shielded write and read wires on a support for a magnetic media drive'20056,296,158'Disposable spout for cans'20016,120,531'Physiotherapy fiber, shoes, fabric, and clothes utilizing electromagnetic energy'20005,849,026'Physiotherapy method'19985,828,528'MR sensors with selected resistances for the sensing and biasing layers to enhance reading capabilities'19985,814,078'Method and apparatus for regulating and improving the status of development and survival of living organisms'19985,792,184'Apparatus for generating electromagnetic radiation'19985,144,554'Apparatus for diagnosing and providing therapy for gastrointestinal diseases without causing patient discomfort and injury'1992

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1992–2020Patents assigned to ZHOU LIN (17)· patent assignee history
1998–2000Based in Towaco, NJ, US· patent location history
2005–2017Patents assigned to IBM (24)· patent assignee history
2005–2008Based in Fishkill, NY, US· patent location history
2006–2020Based in Lagrangeville, NY, US· patent location history
2008–2018Patents assigned to SEAGATE TECHNOLOGY LLC (17)· patent assignee history
2008–2018Based in Eagan, MN, US· patent location history
2012–2016Patents assigned to LIU HUIWEN (5)· patent assignee history
2012–2015Patents assigned to EGBERT DALE (4)· patent assignee history
2019–2020Based in Chongqing, CN· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
IBM242005–2017
SEAGATE TECHNOLOGY LLC172008–2018
ZHOU LINself171992–2020
LIU HUIWEN52012–2016
EGBERT DALE42012–2015
Locations
LocationPatentsSpan
Lagrangeville, New York, US242006–2020
Eagan, Minnesota, US172008–2018
Chongqing, CN22019–2020
Fishkill, New York, US22005–2008
Towaco, New Jersey, US21998–2000