Inventor
Sang-Hoon Ahn
Inventor
Goyang-si, KR
Overview
Patents· 53 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H10Wprimary
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h1026%
H01LSemiconductor devices20%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1013%
H10DInorganic electric semiconductor devices12%
H02JElectric power networks4%
Y02EReduction of greenhouse gas [ghg] emissions, related to energy generation, transmission or distribution4%
H01MProcesses or means, e.g. batteries, for the direct conversion of chemical energy into electrical energy3%
H02HEmergency protective circuit arrangements2%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light1%
G01NInvestigating or analysing materials by determining their chemical or physical properties1%
PatentTitleYear
10,867,923Semiconductor device202010,847,454Semiconductor devices202010,840,564Battery protection circuit module and battery pack comprising same202010,756,550Battery protection circuit module and battery pack comprising same202010,700,164Semiconductor devices202010,535,600Semiconductor device202010,529,618Methods of manufacturing a semiconductor device202010,510,658Semiconductor devices201910,497,649Integrated circuit device and method of manufacturing the same201910,475,739Semiconductor device201910,461,027Semiconductor device including via plug and method of forming the same201910,310,308Curved transparent substrate including an alkali-free substrate, curved display panel including the same and method of manufacturing the same201910,283,981Protection IC and semiconductor integrated circuit201910,276,505Integrated circuit device and method of manufacturing the same201910,217,820Semiconductor devices201910,192,782Method of manufacturing semiconductor device using a plurality of etch stop layers201910,109,731Power MOSFET and method for manufacturing the same201810,090,690Secondary battery protection circuit201810,008,407Methods of manufacturing semiconductor devices including conductive structures20189,984,921Semiconductor device and method of manufacturing the same20189,929,098'Copper via with barrier layer and cap layer'20189,865,594'Semiconductor devices'20189,826,990Reamer for implant surgery20179,812,353'Semiconductor device and method of manufacturing the same'20179,812,450'Semiconductor devices and methods of manufacturing the same'20179,799,606'Semiconductor device and method of fabricating the same'20179,793,347'Semiconductor device and method of fabricating the same'20179,787,111'Battery protection module package'20179,767,450'Antenna module package, antenna module package circuit, battery pack including the same and mobile device including the same'20179,728,604'Semiconductor devices'20179,680,973'Electronic device capable of NFC communication'20179,666,478'Methods of forming wiring structures and methods of manufacturing semiconductor devices'20179,653,400'Semiconductor device and method of manufacturing the same'20179,633,836'Methods of forming semiconductor devices including low-k dielectric layer'20179,620,361'Apparatus for and method of crystallizing active layer of thin film transistor'20179,450,428'Package module of battery protection circuit'20169,390,966'Methods of forming wiring structures and methods of fabricating semiconductor devices'20169,281,277'Methods of forming wiring structures'20169,224,593'Method of manufacturing a semiconductor device having a porous, low-k dielectric layer'20159,214,381'Semiconductor device and method of fabricating the same'20159,048,172'Method of manufacturing white light emitting device (LED) and apparatus measuring phosphor film'20158,872,354'Method of forming through silicon via of semiconductor device using low-K dielectric material'20148,748,847'Method of manufacturing white light emitting device (LED) and apparatus measuring phosphor film'20148,736,018'Semiconductor devices and methods of manufacturing semiconductor devices'20148,581,334'Via structures and semiconductor devices having the via structures'20138,569,862'Integrated circuit devices with crack-resistant fuse structures'20138,524,615'Method of forming hardened porous dielectric layer and method of fabricating semiconductor device having hardened porous dielectric layer'20138,455,985'Integrated circuit devices having selectively strengthened composite interlayer insulation layers and methods of fabricating the same'20138,426,308'Method of forming through silicon via of semiconductor device using low-k dielectric material'20138,404,579'Methods of forming integrated circuit devices with crack-resistant fuse structures'20138,367,535'Method of fabricating semiconductor device'20138,298,910'Method of fabricating semiconductor device'20127,867,924'Methods of reducing impurity concentration in isolating films in semiconductor devices'2011Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2011–2020Patents assigned to SAMSUNG ELECTRONICS CO LTD (41)· patent assignee history
2011–2015Based in Gyeonggi-do, KR· patent location history
2012–2017Patents assigned to AHN SANG-HOON (12)· patent assignee history
2012–2020Based in Hwaseong-si, KR· patent location history
2013–2015Patents assigned to CHOI GIL-HEYUN (6)· patent assignee history
2013–2015Patents assigned to HAN KYU-HEE (6)· patent assignee history
2016–2020Patents assigned to ITM SEMICONDUCTOR CO LTD (9)· patent assignee history
2016–2020Based in Goyang-si, KR· patent location history
2016–2018Based in Cheongju-si, KR· patent location history
2017–2020Based in Chungcheongbuk-do, KR· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| SAMSUNG ELECTRONICS CO LTD | 41 | 2011–2020 |
| AHN SANG-HOONself | 12 | 2012–2017 |
| ITM SEMICONDUCTOR CO LTD | 9 | 2016–2020 |
| CHOI GIL-HEYUN | 6 | 2013–2015 |
| HAN KYU-HEE | 6 | 2013–2015 |
Locations
| Location | Patents | Span |
|---|---|---|
| Goyang-si, KR | 22 | 2016–2020 |
| Hwaseong-si, KR | 15 | 2012–2020 |
| Chungcheongbuk-do, KR | 6 | 2017–2020 |
| Gyeonggi-do, KR | 4 | 2011–2015 |
| Cheongju-si, KR | 3 | 2016–2018 |