Inventor
Kayoko Oomiya
Inventor
Yokohama, JP
Overview
Patents· 11 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties40%
C12QMeasuring or testing processes involving enzymes, nucleic acids or microorganisms15%
G02BOptical elements, systems or apparatus15%
A61BDiagnosis10%
G02FOptical devices or arrangements for the control of light by modification of the optical properties of the media of the elements involved therein5%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h105%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h105%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests5%
PatentTitleYear
9,274,104'Measuring system using optical waveguide, measuring device, measuring method, optical waveguide type sensor chip, and magnetic fine particle'20169,075,017'Optical-waveguide sensor chip, method of manufacturing the same, method of measuring substance, substance-measuring kit and optical-waveguide sensor'20158,642,319'Optical-waveguide sensor chip, method of manufacturing the same, method of measuring substance, substance-measuring kit and optical-waveguide sensor'20148,372,630'Optical glucose sensor chip and method of manufacturing the same'20137,738,934'Biological component measuring apparatus and method'20107,678,567'Optical biosensor'20107,651,864'Coating solution for glucose sensing membrane and method of manufacturing optical glucose sensor chip'20107,498,145'Concentration measuring method, concentration measuring kit, and sensor chip for use in the method'20097,410,614'Optical waveguide type iontophoresis sensor chip and method for packaging sensor chip'20087,269,308'Optical waveguide type biochemical sensor chip and method of manufacturing the same'20076,506,675'Copper film selective formation method'2003Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2003–2016Patents assigned to TOSHIBA KK (11)· patent assignee history
2003–2015Based in Yokohama, JP· patent location history
2010–2016Based in Kanagawa, JP· patent location history
2013–2016Patents assigned to OOMIYA KAYOKO (3)· patent assignee history
2013–2016Patents assigned to HIRAKAWA MASAAKI (2)· patent assignee history
2014–2016Patents assigned to KASAI SHINGO (2)· patent assignee history
2014–2016Patents assigned to NAWATA ISAO (2)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| TOSHIBA KK | 11 | 2003–2016 |
| OOMIYA KAYOKOself | 3 | 2013–2016 |
| HIRAKAWA MASAAKI | 2 | 2013–2016 |
| KASAI SHINGO | 2 | 2014–2016 |
| NAWATA ISAO | 2 | 2014–2016 |
Locations
| Location | Patents | Span |
|---|---|---|
| Yokohama, JP | 9 | 2003–2015 |
| Kanagawa, JP | 2 | 2010–2016 |