Inventor

Yoshihiro Hashimoto

Inventor

Tokyo, JP

Overview

78→

Patents

1977–2021

Patent span

Physics

Primary field (CPC G)

Patents· 78 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Rprimary

G01RMeasuring electric variables21%

G02FOptical devices or arrangements for the control of light by modification of the optical properties of the media of the elements involved therein11%

G02BOptical elements, systems or apparatus7%

G06FElectric digital data processing5%

C12PFermentation or enzyme-using processes to synthesise a desired chemical compound or composition or to separate optical isomers from a racemic mixture4%

G05FSystems for regulating electric or magnetic variables4%

C23CCoating metallic material2%

H01JElectric discharge tubes or discharge lamps2%

H04BTransmission2%

B22FWorking metallic powder2%

PatentTitleYear

11,130,302Bead core coating method and bead core coating apparatus2021 11,123,938Bead core coating method and bead core coating apparatus2021 10,288,639Wheel speed detecting device2019 10,093,385Straddle-type vehicle2018 9,989,870Image formation apparatus, transparent developer and developer cartridge2018 9,939,127Illumination device2018 9,310,619'Optical film'2016 9,217,552'Illumination device'2015 9,122,097'Backlight system and LCD device using the same'2015 9,023,565'Developer, developer container, image formation unit, and image formation apparatus'2015 8,935,373'Management system and computer system management method'2015 8,922,735'Backlight system and liquid crystal display device using the same'2014 8,810,752'Thin backlight system and liquid crystal display device using the same'2014 8,558,560'Test apparatus, additional circuit and test board for judgment based on peak current'2013 8,558,559'Test apparatus, additional circuit and test board for calculating load current of a device under test'2013 8,433,546'Response surface modeling device, response surface modeling method, and response surface modeling program'2013 8,199,278'Surface light source device'2012 8,164,351'Test apparatus'2012 8,054,404'Surface light source device'2011 7,991,487'Method, computer, and recording medium storing a program for computing engine design variables'2011 7,952,361'Test apparatus'2011 7,899,338'Method and device for controlling bias of optical modulator'2011 7,869,668'Method for generating carrier residual signal and its device'2011 7,860,584'Method, computer, and recording medium storing a program for computing an optimal solution to engine design variables'2010 7,825,666'Test apparatus and measurement apparatus for measuring an electric current consumed by a device under test'2010 7,804,293'Power supply and stabilizer'2010 7,751,724'Optical modulator'2010 7,697,846'Method for changing frequency and base station in radio optical fusion communication system'2010 7,576,555'Current measuring apparatus, test apparatus, current measuring method and test method'2009 7,362,104'Current measurement device and test device'2008 7,330,024'Power supply device, test apparatus, and power supply voltage stabilizing device'2008 7,313,292'Optical component using optical transmission element joining metal holder'2007 7,170,602'Particle monitoring device and processing apparatus including same'2007 7,138,819'Differential voltage measuring apparatus and semiconductor testing apparatus'2006 7,132,844'Testing device and testing method for testing an electronic device'2006 7,035,488'Optical waveguide element'2006 7,009,758'Light control element'2006 7,005,867'Power supply circuit and testing device'2006 6,975,978'Method and apparatus for fault simulation of semiconductor integrated circuit'2005 6,828,815'Method and apparatus for defect analysis of semiconductor integrated circuit'2004 6,801,049'Method and apparatus for defect analysis of semiconductor integrated circuit'2004 6,781,364'Electron device testing apparatus having high current and low current testing features'2004 6,756,774'Constant voltage source, a constant voltage source circuit board and a method for applying a constant voltage'2004 6,593,765'Testing apparatus and testing method for semiconductor integrated circuit'2003 6,522,792'Light modulator of waveguide type'2003 6,492,831'Current measuring method and current measuring apparatus'2002 6,404,220'IC testing method and IC testing device using the same'2002 6,391,667'Power supply unit, semiconductor device testing apparatus and semiconductor device testing method'2002 6,327,006'TFT-LCD having shielding layers on TFT-substrate'2001 6,323,668'IC testing device'2001 6,313,657'IC testing apparatus and testing method using same'2001 6,255,839'Voltage applied type current measuring circuit in an IC testing apparatus'2001 6,255,842'Applied-voltage-based current measuring method and device'2001 6,223,686'Apparatus for forming a thin film by plasma chemical vapor deposition'2001 6,089,185'Thin film forming apparatus'2000 6,060,131'Method of forming a thin film by plasma chemical vapor deposition'2000 5,981,238'Process for producing optically active aminopolycarboxylic acid'1999 5,874,827'Voltage supply circuit for a load absorbing high tentative peak current'1999 5,784,132'Display device'1998 5,753,672'Imidazopyridine derivatives and process for preparing the same'1998 5,714,357'Process for producing optically active .alpha.-hydroxycarboxylic acid having phenyl group'1998 5,707,836'Production of alkylene or phenylenediamine disuccinic acid from fumaric acid and a diamine using lyase from microbes'1998 5,708,485'Active matrix display device'1998 5,654,180'Hybrid plasmid vectors, recombinant plasmids containing genes encoding nitrile degrading enzymes, transformants containing the recombinant plasmids and methods of producing amides and acids using the transformants'1997 5,594,359'Voltage generating circuit for IC test'1997 5,580,765'Process for producing optically active a-hydroxycarboxylic acid having phenyl group using gordona terrae'1996 5,508,181'Process for producing alpha-hydroxy acid or alpha-hydroxyamide by microorganisms'1996 5,246,857'Circular plasmids derived from the genus rhodococcus'1993 4,985,672'Test equipment for a low current IC'1991 4,964,209'Method for producing a wire incrusted with abrasive grain'1990 4,866,888'Wire incrusted with abrasive grain'1989 4,775,429'Large diameter high strength rolled steel bar and a process for the production of the same'1988 4,526,627'Method and apparatus for direct heat treatment of medium- to high-carbon steel rods'1985 4,170,276'Motor with selectable speed clutch'1979 4,088,933'DC Motor phase control system'1978 4,042,812'Pulse distribution method and apparatus'1977 4,007,410'Numerical control pulse distribution system'1977 4,001,384'Process for recovery of oxides of sulfur from combustion waste gas'1977

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1991–2013Patents assigned to ADVANTEST CORP (28)· patent assignee history

1993–2018Based in Tokyo, JP· patent location history

1996–2013Based in Kanagawa, JP· patent location history

1997–2002Based in Urawa, JP· patent location history

2001–2019Based in Saitama, JP· patent location history

2003–2011Patents assigned to SUMITOMO OSAKA CEMENT CO LTD (7)· patent assignee history

2011–2018Patents assigned to SHARP KK (8)· patent assignee history

2011–2018Patents assigned to UNIV TOHOKU (8)· patent assignee history

2011–2018Based in Osaka, JP· patent location history

2012–2015Patents assigned to HASHIMOTO YOSHIHIRO (9)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees

Assignee	Patents	Span
ADVANTEST CORP	28	1991–2013
HASHIMOTO YOSHIHIROself	9	2012–2015
SHARP KK	8	2011–2018
UNIV TOHOKU	8	2011–2018
SUMITOMO OSAKA CEMENT CO LTD	7	2003–2011

Locations

Location	Patents	Span
Tokyo, JP	24	1993–2018
Kanagawa, JP	12	1996–2013
Saitama, JP	8	2001–2019
Osaka, JP	8	2011–2018
Urawa, JP	6	1997–2002