LexDanaLexDanabeta
Inventor

Yuta Urano

Inventor
Yokohama, JP

Overview

70→
Patents
2008–2020
Patent span
Physics
Primary field (CPC G)

Patents· 70 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties60%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1012%
G01BMeasuring length, thickness or similar linear dimensions7%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light4%
H01LSemiconductor devices4%
G06TImage data processing or generation, in general3%
H04NPictorial communication, e.g. television3%
B82YSpecific uses or applications of nanostructures1%
C12MApparatus for enzymology or microbiology1%
G01QScanning-probe techniques or apparatus1%
PatentTitleYear
10,830,706Defect inspection apparatus and defect inspection method202010,823,686X-ray inspection method and X-ray inspection device202010,663,844Projection control apparatus and control method thereof, and projection system202010,401,300Defect observation method and device and defect detection device201910,352,879X-ray inspection method and device201910,261,026Defect inspection method, low light detecting method, and low light detector201910,254,235Defect inspecting method and defect inspecting apparatus201910,228,332Defect inspection device and defect inspection method20199,841,384'Defect inspecting method and defect inspecting apparatus'20179,773,641'Method and apparatus for observing defects'20179,733,194'Method for reviewing a defect and apparatus'20179,678,021'Method and apparatus for inspecting defects'20179,645,094'Defect inspection device and defect inspection method'20179,606,071'Defect inspection method and device using same'20179,588,055'Defect inspection apparatus and defect inspection method'20179,588,054'Defect inspection method, low light detecting method and low light detector'20179,568,439'Defect inspection device and defect inspection method'20179,523,648'Defect inspection device and defect inspection method'20169,506,876'X-ray inspection device, inspection method, and X-ray detector'20169,506,872'Inspection apparatus'20169,488,596'Defect inspection method and device for same'20169,470,640'Defect inspection method and defect inspection device'20169,329,136'Defect inspection device and defect inspection method'20169,329,137'Defect inspection method and device using same'20169,310,318'Defect inspection method and defect inspection device'20169,291,574'Defect inspection method and defect inspection device'20169,255,888'Defect inspection method and device for same'20169,228,960'Defect inspecting method and defect inspecting apparatus'20169,109,194'Device for harvesting bacterial colony and method therefor'20159,041,921'Defect inspection device and defect inspection method'20159,007,581'Inspection method and inspection device'20158,958,062'Defect inspection method and device using same'20158,922,764'Defect inspection method and defect inspection apparatus'20148,804,110'Fault inspection device and fault inspection method'20148,755,041'Defect inspection method and apparatus'20148,748,795'Method for inspecting pattern defect and device for realizing the same'20148,711,347'Defect inspection method and device therefor'20148,705,026'Inspection apparatus'20148,670,116'Method and device for inspecting for defects'20148,654,350'Inspecting method and inspecting apparatus for substrate surface'20148,638,429'Defect inspecting method and defect inspecting apparatus'20148,599,369'Defect inspection device and inspection method'20138,514,388'Flaw inspecting method and device therefor'20138,482,727'Defect inspection method'20138,477,302'Defect inspection apparatus'20138,462,330'Method and apparatus for detecting defects'20138,427,634'Defect inspection method and apparatus'20138,314,929'Method and its apparatus for inspecting defects'20128,310,665'Inspecting method and inspecting apparatus for substrate surface'20128,274,652'Defect inspection system and method of the same'20128,264,679'Inspection apparatus'20128,218,138'Apparatus and method for inspecting defects'20128,144,337'Inspecting method and inspecting apparatus for substrate surface'20128,120,766'Inspection apparatus'20128,115,915'Defect inspection method and apparatus'20128,107,065'Method and apparatus for detecting defects'20127,973,920'Apparatus and method for inspecting defects'20117,965,386'Method and its apparatus for inspecting defects'20117,916,288'Defect inspection method'20117,869,024'Method and its apparatus for inspecting defects'20117,859,656'Defect inspection method and system'20107,777,876'Inspection method and inspection device'20107,768,635'Apparatus and method for inspecting defects'20107,751,037'Method and apparatus for detecting defects'20107,675,613'Defect inspection method'20107,664,608'Defect inspection method and apparatus'20107,528,942'Method and apparatus for detecting defects'20097,492,452'Defect inspection method and system'20097,465,935'Method for inspecting pattern defect and device for realizing the same'20087,333,192'Apparatus and method for inspecting defects'2008

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2008–2020Patents assigned to HITACHI HIGH TECH CORP (68)· patent assignee history
2008–2019Based in Yokohama, JP· patent location history
2012–2017Patents assigned to URANO YUTA (30)· patent assignee history
2012–2015Patents assigned to NAKAO TOSHIYUKI (18)· patent assignee history
2012–2014Patents assigned to OSHIMA YOSHIMASA (11)· patent assignee history
2013–2017Patents assigned to HONDA TOSHIFUMI (12)· patent assignee history
2016–2020Based in Tokyo, JP· patent location history
2020Based in Kawasaki, JP· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
HITACHI HIGH TECH CORP682008–2020
URANO YUTAself302012–2017
NAKAO TOSHIYUKI182012–2015
HONDA TOSHIFUMI122013–2017
OSHIMA YOSHIMASA112012–2014
Locations
LocationPatentsSpan
Yokohama, JP492008–2019
Tokyo, JP202016–2020
Kawasaki, JP12020