Inventor
Chang-Nyun Kim
Inventor
Cheonan-si, KR
Overview
Patents· 5 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G11Cprimary
G11CStatic stores45%
G01RMeasuring electric variables36%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1018%
PatentTitleYear
7,256,594'Method and apparatus for testing semiconductor devices using the back side of a circuit board'20077,075,325'Method and apparatus for testing semiconductor devices using an actual board-type product'20066,833,721'Method and apparatus for testing semiconductor devices using an actual board-type product'20046,819,129'Method and apparatus for testing a non-standard memory device under actual operating conditions'20046,771,088'Method and apparatus for testing semiconductor devices using the back side of a circuit board'2004Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2004–2007Patents assigned to SAMSUNG ELECTRONICS CO LTD (5)· patent assignee history
2004–2007Based in Cheonan-si, KR· patent location history
2004Based in Chungcheongnam-do, KR· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| SAMSUNG ELECTRONICS CO LTD | 5 | 2004–2007 |
Locations
| Location | Patents | Span |
|---|---|---|
| Cheonan-si, KR | 4 | 2004–2007 |
| Chungcheongnam-do, KR | 1 | 2004 |