Inventor
Peter Roentgen
Inventor
Thalwil, CH
Overview
Patents· 22 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Jprimary
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light15%
H01SDevices using the process of light amplification by stimulated emission of radiation [laser] to amplify or generate light11%
G02BOptical elements, systems or apparatus10%
H01LSemiconductor devices10%
H10FInorganic semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation10%
H10DInorganic electric semiconductor devices5%
H10HInorganic light-emitting semiconductor devices having potential barriers5%
B82YSpecific uses or applications of nanostructures3%
G01NInvestigating or analysing materials by determining their chemical or physical properties3%
H04NPictorial communication, e.g. television3%
PatentTitleYear
11,112,304Spectrometer calibration202111,067,446Compact spectrometer modules202111,022,491Compact, power-efficient stacked broadband optical emitters202110,771,714Image sensor modules including primary high-resolution imagers and secondary imagers202010,680,023Optoelectronic modules having a silicon substrate, and fabrication methods for such modules202010,656,014Compact, power-efficient stacked broadband optical emitters202010,488,518Optoelectronic module operable for distance measurements201910,488,264Determining spectral emission characteristics of incident radiation201910,444,477Wafer-level fabrication of optical devices with front focal length correction201910,302,279Light conversion modules having a laser diode light conversion assembly and long pass filter reflecting light back to the light conversion assembly201910,283,542Optoelectronic modules having a silicon substrate, and fabrication methods for such modules20199,977,153Stacks of arrays of beam shaping elements including stacking, self-alignment and/or self-centering features20189,970,816Light sensor modules and spectrometers including an optical grating structure20189,945,756Measurement of focal points and other features in optical systems20189,711,552'Optoelectronic modules having a silicon substrate, and fabrication methods for such modules'20179,237,264'Method of manufacturing a plurality of optical devices for cameras'20169,121,759'Arrangements for detecting light of different wavelength at different angles'20156,204,560'Titanium nitride diffusion barrier for use in non-silicon technologies and method'20015,940,424'Semiconductor lasers and method for making the same'19995,373,166'Modulated strain heterostructure light emitting device'19945,153,890'Semiconductor device comprising a layered structure grown on a structured substrate'19925,037,776'Method for the epitaxial growth of a semiconductor structure'1991Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1991–1999Patents assigned to IBM (4)· patent assignee history
1991–2021Based in Thalwil, CH· patent location history
2015–2021Patents assigned to HEPTAGON MICRO OPTICS PTE LTD (7)· patent assignee history
2016–2019Patents assigned to MALUCK MATTHIAS (2)· patent assignee history
2016–2019Patents assigned to ROENTGEN PETER (2)· patent assignee history
2019–2021Patents assigned to AMS SENSORS SINGAPORE PTE LTD (10)· patent assignee history
2021Based in Singapore, SG· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| AMS SENSORS SINGAPORE PTE LTD | 10 | 2019–2021 |
| HEPTAGON MICRO OPTICS PTE LTD | 7 | 2015–2021 |
| IBM | 4 | 1991–1999 |
| MALUCK MATTHIAS | 2 | 2016–2019 |
| ROENTGEN PETERself | 2 | 2016–2019 |
Locations
| Location | Patents | Span |
|---|---|---|
| Thalwil, CH | 21 | 1991–2021 |
| Singapore, SG | 1 | 2021 |