Inventor
Yasuhiro Tokunaga
Inventor
Tokyo, JP
Overview
Patents· 6 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G11Cprimary
G11CStatic stores43%
G01KMeasuring temperature14%
G01RMeasuring electric variables14%
G06FElectric digital data processing14%
Y02DClimate change mitigation technologies in information and communication technologies [ict], i.e. information and communication technologies aiming at the reduction of their own energy use14%
PatentTitleYear
8,281,158'Semiconductor integrated circuit'20127,649,373'Semiconductor integrated circuit with voltage drop detector'20106,896,408'Temperature detection from differences in off leak currents of NMOS and PMOS transistors on CPU chip'20056,195,771'Semiconductor device having semiconductor memory circuit to be tested, method of testing semiconductor memory circuit and read circuit for semiconductor memory circuit'20015,444,662'Dynamic random access memory with bit line equalizing means'19955,274,585'Semiconductor memory device'1993Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1993–2005Patents assigned to OKI ELECTRIC IND CO LTD (4)· patent assignee history
1993–2012Based in Tokyo, JP· patent location history
2005Based in Kanagawa, JP· patent location history
2010Patents assigned to OKI SEMICONDUCTOR CO LTD (1)· patent assignee history
2012Patents assigned to LAPIS SEMICONDUCTOR CO LTD (1)· patent assignee history
2012Patents assigned to TOKUNAGA YASUHIRO (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| OKI ELECTRIC IND CO LTD | 4 | 1993–2005 |
| LAPIS SEMICONDUCTOR CO LTD | 1 | 2012 |
| OKI SEMICONDUCTOR CO LTD | 1 | 2010 |
| TOKUNAGA YASUHIROself | 1 | 2012 |
Locations
| Location | Patents | Span |
|---|---|---|
| Tokyo, JP | 5 | 1993–2012 |
| Kanagawa, JP | 1 | 2005 |