Inventor
Peter Poechmueller
Inventor
Unterhaching, DE
Overview
Patents· 32 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G11Cprimary
G11CStatic stores63%
G01RMeasuring electric variables9%
H03KPulse technique9%
G06FElectric digital data processing7%
H05KPrinted circuits5%
H04LTransmission of digital information, e.g. telegraphic communication2%
H10BElectronic memory devices2%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h102%
PatentTitleYear
7,372,749'Methods for repairing and for operating a memory component'20087,373,562'Memory circuit comprising redundant memory areas'20087,372,750'Integrated memory circuit and method for repairing a single bit error'20087,359,259'Method for transmission and reception of a data signal on a line pair, as well as a transmission and reception circuit for this purpose'20087,349,286'Memory component and addressing of memory cells'20087,325,182'Method and circuit arrangement for testing electrical modules'20087,317,248'Memory module having memory chips protected from excessive heat'20087,298,174'Circuit and method for generating an output signal'20077,248,067'Semiconductor device with test circuit disconnected from power supply connection'20077,231,488'Self-refresh system and method for dynamic random access memory'20077,170,798'Controlled substrate voltage for memory switches'20077,162,382'Apparatus and method for calibrating signals'20077,134,102'Automated layout transformation system and method'20067,061,408'Concept for a secure data communication between electronic devices'20066,975,550'Array transistor amplification method and apparatus for dynamic random access memory'20056,947,306'Backside of chip implementation of redundancy fuses and contact pads'20056,940,773'Method and system for manufacturing DRAMs with reduced self-refresh current requirements'20056,922,338'Memory module with a heat dissipation means'20056,865,707'Test data generator'20056,847,571'Use of redundant memory cells to manufacture cost efficient drams with reduced self refresh current capability'20056,744,272'Test circuit'20046,711,648'Methods and apparatus for increasing data bandwidth in a dynamic memory device by generating a delayed address transition detection signal in response to a column address strobe signal'20046,674,674'Method for recognizing and replacing defective memory cells in a memory'20046,618,305'Test circuit for testing a circuit'20036,522,578'Method for preventing electromigration in an MRAM'20036,504,751'Integrated memory having memory cells with a magnetoresistive storage property and method of operating such a memory'20036,477,081'Integrated memory having memory cells with a magnetoresistive storage property'20026,373,286'Integrated circuit with improved off chip drivers'20026,137,316'Integrated circuit with improved off chip drivers'20006,018,483'Distributed block redundancy for memory devices'20005,889,420'OCD with low output capacitance'19995,859,801'Flexible fuse placement in redundant semiconductor memory'1999Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1999–2002Patents assigned to SIEMENS AG (5)· patent assignee history
1999–2004Based in Burlington, VT, US· patent location history
2000–2002Based in Munich, DE· patent location history
2002–2008Patents assigned to INFINEON TECHNOLOGIES AG (25)· patent assignee history
2002Patents assigned to IBM (1)· patent assignee history
2002–2005Based in Colchester, VT, US· patent location history
2004Patents assigned to SIEMENS AG KABUSHIKI KAISHA TO (1)· patent assignee history
2005–2007Based in Unterhaching, DE· patent location history
2007–2008Based in Dresden, DE· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| INFINEON TECHNOLOGIES AG | 25 | 2002–2008 |
| SIEMENS AG | 5 | 1999–2002 |
| IBM | 1 | 2002 |
| SIEMENS AG KABUSHIKI KAISHA TO | 1 | 2004 |
Locations
| Location | Patents | Span |
|---|---|---|
| Unterhaching, DE | 11 | 2005–2007 |
| Dresden, DE | 8 | 2007–2008 |
| Colchester, VT, US | 6 | 2002–2005 |
| Burlington, VT, US | 3 | 1999–2004 |
| Munich, DE | 3 | 2000–2002 |