Inventor
Ichiro Moriyama
Inventor
Hamura, JP
Overview
Patents· 6 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties100%
PatentTitleYear
9,551,670'Surface inspection apparatus and method thereof'20178,729,514'Surface inspection apparatus and method thereof'20147,952,085'Surface inspection apparatus and method thereof'20117,417,244'Surface inspection apparatus and method thereof'20087,242,016'Surface inspection apparatus and method thereof'20076,894,302'Surface inspection apparatus and method thereof'2005Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2005Patents assigned to HITACHI HIGH TECH ELECT ENG CO (1)· patent assignee history
2005–2017Based in Hamura, JP· patent location history
2007–2017Patents assigned to HITACHI HIGH TECH CORP (5)· patent assignee history
2008–2017Patents assigned to HITACHI LTD (3)· patent assignee history
2014Patents assigned to ISHIMARU ICHIRO (1)· patent assignee history
2014Patents assigned to KENBOU YUKIO (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| HITACHI HIGH TECH CORP | 5 | 2007–2017 |
| HITACHI LTD | 3 | 2008–2017 |
| HITACHI HIGH TECH ELECT ENG CO | 1 | 2005 |
| ISHIMARU ICHIRO | 1 | 2014 |
| KENBOU YUKIO | 1 | 2014 |
Locations
| Location | Patents | Span |
|---|---|---|
| Hamura, JP | 6 | 2005–2017 |