Inventor
Kwok K. Ng
Inventor
Warren, NJ, US
Overview
Patents· 19 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H10Dprimary
H10DInorganic electric semiconductor devices30%
G01NInvestigating or analysing materials by determining their chemical or physical properties20%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h1017%
B82BNanostructures formed by manipulation of individual atoms, molecules, or limited collections of atoms or molecules as discrete units10%
B82YSpecific uses or applications of nanostructures7%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h107%
G01RMeasuring electric variables3%
G11CStatic stores3%
H10BElectronic memory devices3%
PatentTitleYear
7,762,121'Method and apparatus for sensing hydrogen gas'20107,537,984'III-V power field effect transistors'20097,511,333'Nonvolatile memory cell with multiple floating gates and a connection region in the channel'20097,367,215'Formation of metal nanowires for use as variable-range hydrogen sensors'20087,287,412'Method and apparatus for sensing hydrogen gas'20077,237,429'Continuous-range hydrogen sensors'20077,180,103'III-V power field effect transistors'20077,104,111'Formation of metal nanowires for use as variable-range hydrogen sensors'20066,849,911'Formation of metal nanowires for use as variable-range hydrogen sensors'20056,509,242'Heterojunction bipolar transistor'20036,395,611'Inductor or low loss interconnect and a method of manufacturing an inductor or low loss interconnect in an integrated circuit'20026,121,101'Process for fabricating bipolar and BiCMOS devices'20005,767,561'Integrated circuit device with isolated circuit elements'19985,744,840'Electrostatic protection devices for protecting semiconductor integrated circuitry'19985,134,447'Neutral impurities to increase lifetime of operation of semiconductor devices'19924,896,108'Test circuit for measuring specific contact resistivity of self-aligned contacts in integrated circuits'19904,763,183'Semiconductor-on-insulator (SOI) devices and SOI IC fabrication method'1988H0000208'Packaging microminiature devices'19874,613,891'Packaging microminiature devices'1986Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1986–1992Patents assigned to AT & T BELL LAB (2)· patent assignee history
1986–1988Based in Union, NJ, US· patent location history
1988–1990Patents assigned to AMERICAN TELEPHONE & TELEGRAPH (2)· patent assignee history
1990–1998Based in Berkeley Heights, NJ, US· patent location history
1998–2000Patents assigned to LUCENT TECHNOLOGIES INC (2)· patent assignee history
1998–2009Based in Warren, NJ, US· patent location history
2003–2009Patents assigned to AGERE SYSTEMS INC (3)· patent assignee history
2005–2008Patents assigned to NANO PROPRIETARY INC (5)· patent assignee history
2005–2008Based in Austin, TX, US· patent location history
2007–2010Based in San Jose, CA, US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| NANO PROPRIETARY INC | 5 | 2005–2008 |
| AGERE SYSTEMS INC | 3 | 2003–2009 |
| AMERICAN TELEPHONE & TELEGRAPH | 2 | 1988–1990 |
| AT & T BELL LAB | 2 | 1986–1992 |
| LUCENT TECHNOLOGIES INC | 2 | 1998–2000 |
Locations
| Location | Patents | Span |
|---|---|---|
| Warren, New Jersey, US | 6 | 1998–2009 |
| San Jose, California, US | 3 | 2007–2010 |
| Austin, Texas, US | 3 | 2005–2008 |
| Berkeley Heights, New Jersey, US | 3 | 1990–1998 |
| Union, New Jersey, US | 3 | 1986–1988 |