Inventor
Thomas B. Lucatorto
Inventor
Washington, DC, US
Overview
Patents· 6 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
B01Dprimary
B01DSeparation38%
G01BMeasuring length, thickness or similar linear dimensions13%
G02BOptical elements, systems or apparatus13%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices13%
H01JElectric discharge tubes or discharge lamps13%
H01SDevices using the process of light amplification by stimulated emission of radiation [laser] to amplify or generate light13%
PatentTitleYear
6,002,740'Method and apparatus for X-ray and extreme ultraviolet inspection of lithography masks and other objects'19994,771,171'Isotope analysis device and method'19884,734,579'Ultrasensitive method for measuring isotope abundance ratios'19884,634,864'Ultrasensitive method for measuring isotope abundance ratios'19874,395,775'Optical devices utilizing multicapillary arrays'19834,390,994'Laser utilizing coated, multicapillary array as output window'1983Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1983Patents assigned to LUCATORTO THOMAS B (2)· patent assignee history
1983Patents assigned to MCILRATH THOMAS J (2)· patent assignee history
1983Patents assigned to ROBERTS JAMES R (2)· patent assignee history
1983–1999Based in Washington, DC, US· patent location history
1987–1988Patents assigned to ATOM SCIENCES INC (2)· patent assignee history
1988Patents assigned to ATOM SCIENCES CORP (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| ATOM SCIENCES INC | 2 | 1987–1988 |
| LUCATORTO THOMAS Bself | 2 | 1983 |
| MCILRATH THOMAS J | 2 | 1983 |
| ROBERTS JAMES R | 2 | 1983 |
| ATOM SCIENCES CORP | 1 | 1988 |
Locations
| Location | Patents | Span |
|---|---|---|
| Washington, DC, US | 6 | 1983–1999 |