Inventor
Trudo Clarysse
Inventor
Antwerpen, BE
Overview
Patents· 6 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties44%
G01RMeasuring electric variables44%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1011%
PatentTitleYear
8,717,570'Method for determining the active doping concentration of a doped semiconductor region'20148,364,428'Junction-photovoltage method and apparatus for contactless determination of sheet resistance and leakage current of semiconductor'20138,314,628'Method and device for the independent extraction of carrier concentration level and electrical junction depth in a semiconductor substrate'20127,751,035'Method and device to quantify active carrier profiles in ultra-shallow semiconductor structures'20107,133,128'System and method for measuring properties of a semiconductor substrate in a non-destructive way'20065,995,912'Database and method for measurement correction for cross-sectional carrier profiling techniques'1999Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1999–2010Based in Antwerpen, BE· patent location history
2006Patents assigned to IMEC INTER UNI MICRO ELECTR (1)· patent assignee history
2010–2014Patents assigned to IMEC (4)· patent assignee history
2010–2014Patents assigned to UNIV LEUVEN KATH (2)· patent assignee history
2012–2013Patents assigned to CLARYSSE TRUDO (2)· patent assignee history
2012Patents assigned to DORTU FABIAN (1)· patent assignee history
2012–2013Based in Antwerp, BE· patent location history
2014Based in Leuven, BE· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| IMEC | 4 | 2010–2014 |
| CLARYSSE TRUDOself | 2 | 2012–2013 |
| UNIV LEUVEN KATH | 2 | 2010–2014 |
| DORTU FABIAN | 1 | 2012 |
| IMEC INTER UNI MICRO ELECTR | 1 | 2006 |
Locations
| Location | Patents | Span |
|---|---|---|
| Antwerpen, BE | 3 | 1999–2010 |
| Antwerp, BE | 2 | 2012–2013 |
| Leuven, BE | 1 | 2014 |