Inventor

Yeow Kheng Lim

Inventor
Singapore, SG

Overview

25→
Patents
2001–2016
Patent span
Electricity
Primary field (CPC H)

Patents· 25 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

H10Wprimary
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h1052%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1022%
H10DInorganic electric semiconductor devices13%
H01LSemiconductor devices7%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests7%
PatentTitleYear
9,318,378'Slot designs in wide metal lines'20168,957,523'Dielectric posts in metal layers'20158,860,185'Crack-arresting structure for through-silicon vias'20148,766,454'Integrated circuit with self-aligned line and via'20148,759,947'Back-side MOM/MIM devices'20148,716,856'Device with integrated power supply'20148,466,062'TSV backside processing using copper damascene interconnect technology'20138,358,007'Integrated circuit system employing low-k dielectrics and method of manufacture thereof'20137,790,617'Formation of metal silicide layer over copper interconnect for reliability enhancement'20107,372,156'Method to fabricate aligned dual damascene openings'20087,253,097'Integrated circuit system using dual damascene process'20077,119,010'Integrated circuit with self-aligned line and via and manufacturing method therefor'20066,967,156'Method to fabricate aligned dual damascene openings'20056,849,928'Dual silicon-on-insulator device wafer die'20056,780,691'Method to fabricate elevated source/drain transistor with large area for silicidation'20046,613,652'Method for fabricating SOI devices with option of incorporating air-gap feature for better insulation and performance'20036,558,994'Dual silicon-on-insulator device wafer die'20036,518,133'Method for fabricating a small dimensional gate with elevated source/drain structures'20036,472,697'Assorted aluminum wiring design to enhance chip-level performance for deep sub-micron application'20026,468,880'Method for fabricating complementary silicon on insulator devices using wafer bonding'20026,432,797'Simplified method to reduce or eliminate STI oxide divots'20026,399,471'Assorted aluminum wiring design to enhance chip-level performance for deep sub-micron application'20026,380,084'Method to form high performance copper damascene interconnects by de-coupling via and metal line filling'20026,355,563'Versatile copper-wiring layout design with low-k dielectric integration'20026,319,767'Method to eliminate top metal corner shaping during bottom metal patterning for MIM capacitors via plasma ashing and hard masking technique'2001

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2001–2010Patents assigned to CHARTERED SEMICONDUCTOR MFG (15)· patent assignee history
2001–2016Based in Singapore, SG· patent location history
2013–2016Patents assigned to GLOBALFOUNDRIES SG PTE LTD (8)· patent assignee history
2013–2016Patents assigned to LIM YEOW KHENG (7)· patent assignee history
2013–2014Patents assigned to TAN JUAN BOON (5)· patent assignee history
2014Patents assigned to GONG SHUNQIANG (2)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
CHARTERED SEMICONDUCTOR MFG152001–2010
GLOBALFOUNDRIES SG PTE LTD82013–2016
LIM YEOW KHENGself72013–2016
TAN JUAN BOON52013–2014
GONG SHUNQIANG22014
Locations
LocationPatentsSpan
Singapore, SG252001–2016