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Inventor

Morihiko Hamada

Inventor
Kawasaki, JP

Overview

3→
Patents
2004–2007
Patent span
Physics
Primary field (CPC G)

Patents· 3 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Rprimary
G01RMeasuring electric variables67%
G11CStatic stores33%
PatentTitleYear
7,256,591'Probe card, having cantilever-type probe and method'20077,171,592'Self-testing circuit in semiconductor memory device'20076,765,401'Semiconductor testing apparatus for conducting conduction tests'2004

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2004–2007Patents assigned to FUJITSU LTD (3)· patent assignee history
2004–2007Based in Kawasaki, JP· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
FUJITSU LTD32004–2007
Locations
LocationPatentsSpan
Kawasaki, JP32004–2007