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Inventor

Seung-Jun Shin

Inventor
Incheon, KR

Overview

17→
Patents
2010–2021
Patent span
Physics
Primary field (CPC G)

Patents· 17 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G11Cprimary
G11CStatic stores26%
G06FElectric digital data processing18%
H10DInorganic electric semiconductor devices10%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h108%
B82YSpecific uses or applications of nanostructures5%
G01QScanning-probe techniques or apparatus5%
H01LSemiconductor devices5%
H10BElectronic memory devices5%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h105%
E04DRoof coverings3%
PatentTitleYear
11,114,463Semiconductor device202111,081,152Dynamic random access memory (DRAM) device, memory controller therefor, and memory system202110,754,564Memory device having a plurality of low power states202010,680,007Semiconductor device202010,671,319Memory device configured to store and output address in response to internal command202010,579,263Memory system202010,497,422Memory device performing care operation for disturbed row and operating method thereof201910,115,448Memory device for refresh and memory system including the same201810,114,548Synchronous dynamic random access memory (SDRAM) device, memory controller for same, and method of operating same20189,767,882'Method of refreshing memory device'20179,754,649'Memory system with command mixing for timing control'20179,472,258'Method of operating memory device and method of operating memory system including the same'20168,178,369'Nanoscale multi-junction quantum dot device and fabrication method thereof'20128,158,538'Single electron transistor operating at room temperature and manufacturing method for same'20128,099,793'Scanning probe microscope with automatic probe replacement function'20128,041,445'Transformation method of G-code into step-Nc part program'20117,709,791'Scanning probe microscope with automatic probe replacement function'2010

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2010–2012Patents assigned to PARK SYSTEMS CORP (2)· patent assignee history
2010–2012Based in Seoul, KR· patent location history
2011Based in Goyang-si, KR· patent location history
2012Patents assigned to CHOI JUNG BUM (2)· patent assignee history
2012Patents assigned to NANOCHIPS INC (2)· patent assignee history
2012Patents assigned to SHIN SEUNG JUN (2)· patent assignee history
2012Based in Hongchun-gun, KR· patent location history
2016–2021Patents assigned to SAMSUNG ELECTRONICS CO LTD (12)· patent assignee history
2016–2021Based in Incheon, KR· patent location history
2020–2021Based in Yongin-si, KR· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
SAMSUNG ELECTRONICS CO LTD122016–2021
CHOI JUNG BUM22012
NANOCHIPS INC22012
PARK SYSTEMS CORP22010–2012
SHIN SEUNG JUNself22012
Locations
LocationPatentsSpan
Incheon, KR102016–2021
Yongin-si, KR22020–2021
Hongchun-gun, KR22012
Seoul, KR22010–2012
Goyang-si, KR12011