Inventor
Craig M. Herzinger
Inventor
Lincoln, NE, US
Overview
Patents· 85 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties41%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light33%
G02BOptical elements, systems or apparatus16%
G01BMeasuring length, thickness or similar linear dimensions1%
G06FElectric digital data processing1%
G06KGraphical data reading1%
B29CShaping or joining of plastics1%
B29KIndexing scheme associated with subclasses b29b, b29c or b29d, relating to moulding materials or to materials for moulds, reinforcements, fillers or preformed parts, e.g. inserts1%
B29LIndexing scheme associated with subclass b29c, relating to particular articles1%
B33YAdditive manufacturing, i.e. manufacturing of three-dimensional [3d] objects by additive deposition, additive agglomeration or additive layering, e.g. by 3d printing, stereolithography or selective laser sintering1%
PatentTitleYear
10,989,601Beam focusing and reflective optics202110,914,866Methods and materials for metamaterials exhibiting form-induced birefringence202110,775,298Ellipsometer or polarimeter system having at least one rotating element which is driven by a motor comprising air bearing202010,606,093Biased fast axis retarder system202010,175,160Method to analyze spectroscopic ellipsometry or intensity data of porous samples utilizing the anisotropic bruggeman-effective medium theory201910,101,265Birefringence imaging chromatography based on highly ordered 3D nanostructures201810,073,120Integrated vacuum-ultraviolet, mid and near-ultraviolet, visible, near, mid and far infrared and terahertz optical hall effect (OHE) instrument, and method of use201810,061,068Deviation angle self-compensating substantially achromatic retarder201810,026,167Method of obtaining micrographs of transparent or semi-transparent specimens using anisotropic contrast20189,976,902Method to analyze spectroscopic ellipsometry data of porous samples utilizing the anisotropic Bruggeman-effective medium theory20189,952,141Method of characterizing a beam of electromagnetic radiation in ellipsometer and the like systems20189,921,352'Biased fast axis retarder system'20189,851,294Integrated mid-infrared, far infrared and terahertz optical Hall effect (OHE) instrument, and method of use20179,121,757'Terahertz ellipsometer system, and method of use'20159,041,927'Terahertz-infrared ellipsometer system, and method of use'20158,934,096'Terahertz-infrared ellipsometer system, and method of use'20158,736,838'Terahertz ellipsometer system, and method of use'20148,705,032'Terahertz-infrared ellipsometer system, and method of use'20148,564,777'System and method for compensating detector non-idealities'20138,488,119'Terahertz-infrared ellipsometer system, and method of use'20138,462,341'Mounting for deviation angle self compensating substantially achromatic retarder'20138,416,408'Terahertz-infrared ellipsometer system, and method of use'20138,248,607'Empirical correction for spectroscopic ellipsometric measurements of rough or textured surfaces'20128,169,611'Terahertz-infrared ellipsometer system, and method of use'20128,159,672'Sample investigating system and method of use'20128,013,996'Spatial filter in sample investigation system'20117,907,280'Method of constructing a deviation angle self compensating substantially achromatic retarder to compensate beam traslation'20117,633,625'Spectroscopic ellipsometer and polarimeter systems'20097,623,237'Sample investigating system'20097,616,319'Spectroscopic ellipsometer and polarimeter systems'20097,554,662'Spatial filter means comprising an aperture with a non-unity aspect ratio in a system for investigating samples with electromagnetic radiation'20097,522,279'System for and method of investigating the exact same point on a sample substrate with multiple wavelengths'20097,508,510'System for and method of investigating the exact same point on a sample substrate with multiple wavelengths'20097,468,794'Rotating compensator ellipsometer system with spatial filter equivalent'20087,460,230'Deviation angle self compensating substantially achromatic retarder'20087,450,231'Deviation angle self compensating substantially achromatic retarder'20087,385,697'Sample analysis methodology utilizing electromagnetic radiation'20087,349,092'System for reducing stress induced effects during determination of fluid optical constants'20087,336,361'Spectroscopic ellipsometer and polarimeter systems'20087,327,456'Spectrophotometer, ellipsometer, polarimeter and the like systems'20087,304,737'Rotating or rotatable compensator system providing aberation corrected electromagnetic raadiation to a spot on a sample at multiple angles of a incidence'20077,295,313'Application of intermediate wavelength band spectroscopic ellipsometry to in-situ real time fabrication of multiple layer alternating high/low refractive index filters'20077,280,194'Accurate determination of refractive indices of solid, fluid and liquid materials'20077,274,450'Sample entry purge system in spectrophotometer, ellipsometer, polarimeter and the like systems'20077,265,835'System for implementing variable retarder capability in ellipsometer, polarimeter or the like systems'20077,245,376'Combined spatial filter and relay systems in rotating compensator ellipsometer/polarimeter'20077,239,391'Method of analysis of multiple layer samples'20077,215,424'Broadband ellipsometer or polarimeter system including at least one multiple element lens'20077,193,710'Rotating or rotatable compensator spectroscopic ellipsometer system including multiple element lenses'20077,193,708'Time efficient method for investigating sample systems with spectroscopic electromagnetic radiation'20077,158,231'Spectroscopic ellipsometer and polarimeter systems'20077,151,605'Methodology for providing good data at all wavelengths over a spectroscopic range'20067,136,162'Alignment of ellipsometer beam to sample surface'20067,075,649'Discrete polarization state rotatable compensator spectroscopic ellipsometer system, and method of calibration'20067,057,717'System for and method of investigating the exact same point on a sample substrate with at least two wavelengths'20066,982,792'Spectrophotometer, ellipsometer, polarimeter and the like systems'20066,950,182'Functional equivalent to spatial filter in ellipsometer and the like systems'20056,940,595'Application of spectroscopic ellipsometry to in-situ real time fabrication of multiple layer alternating high/low refractive index filters'20056,937,341'System and method enabling simultaneous investigation of sample with two beams of electromagnetic radiation'20056,930,813'Spatial filter source beam conditioning in ellipsometer and the like systems'20056,831,740'Methodology for improving precision of data acquired by spectrophotometer systems'20046,822,738'Spectroscopic rotating compensator ellipsometer system with pseudo-achromatic retarder system'20046,804,004'Multiple-element lens systems and methods for uncorrelated evaluation of parameters in parameterized mathematical model equations for lens retardance, in ellipometry and polarimetry'20046,795,184'Odd bounce image rotation system in ellipsometer systems'20046,549,282'Methods for uncorrelated evaluation of parameters in parameterized mathematical model equations for lens retardance, in ellipsometry and polarimetry systems'20036,483,586'Beam splitting analyzer means in rotating compensator ellipsometer'20026,456,376'Rotating compensator ellipsometer system with spatial filter'20026,455,853'Determination of thickness and impurity profiles in thin membranes utilizing spectorscopic data obtained from ellipsometric investigation of both front and back surfaces'20026,441,902'Method for evaluating sample system anisotropic refractive indices and orientations thereof in multiple dimensions'20026,353,477'Regression calibrated spectroscopic rotating compensator ellipsometer system with pseudo-achromatic retarder system'20026,141,102'Single trianglular shaped optical retarder element for use in spectroscopic ellipsometer and polarimeter systems'20006,137,618'Compact, high extinction coefficient combination brewster angle and other than brewster angle polarizing system, and method of use'20006,118,537'Multiple tipped berek plate optical retarder elements for use in spectroscopic ellipsometer and polarimeter systems'20006,100,981'Dual horizontally oriented triangle shaped optical retarder element for use in spectroscopic ellipsometer and polarimeter systems'20006,084,675'Adjustable beam alignment compensator/retarder with application in spectroscopic ellipsometer and polarimeter systems'20006,084,674'Parallelogram shaped optical retarder element for use in spectroscopic ellipsometer and polarimeter systems'20006,034,777'Methods for uncorrelated evaluation of parameters in parameterized mathematical model equations for window retardence, in ellipsometer and polarimeter systems'20005,963,327'Total internal reflection electromagnetic radiation beam entry to, and exit from, ellipsometer, polarimeter, reflectometer and the like systems'19995,963,325'Dual vertically oriented triangular shaped optical retarder element for use in spectroscopic ellipsometer and polarimeter systems'19995,956,145'System and method for improving data acquisition capability in spectroscopic rotatable element, rotating element, modulation element, and other ellipsometer and polarimeter and the like systems'19995,946,098'Optical elements for use in spectroscopic ellipsometer and polarimeter systems'19995,936,734'Analysis of partially polarized electromagnetic radiation in ellipsometer and polarimeter systems'19995,835,222'System, and mathematical regression-based method utilizing optical data, for identifying optical axis orientation in material systems such as optical compensators and retarders'19985,796,983'Dielectric function parametric model, and method of use'19985,757,494'System and method for improving data acquisition capability in spectroscopic ellipsometers'1998Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1998–2021Patents assigned to J A WOOLLAM CO INC (80)· patent assignee history
1998–2021Based in Lincoln, NE, US· patent location history
2012–2020Patents assigned to HERZINGER CRAIG M (14)· patent assignee history
2012–2018Patents assigned to LIPHARDT MARTIN M (9)· patent assignee history
2012–2018Patents assigned to UNIV NEBRASKA (9)· patent assignee history
2012–2018Patents assigned to HOFMANN TINO (8)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| J A WOOLLAM CO INC | 80 | 1998–2021 |
| HERZINGER CRAIG Mself | 14 | 2012–2020 |
| LIPHARDT MARTIN M | 9 | 2012–2018 |
| UNIV NEBRASKA | 9 | 2012–2018 |
| HOFMANN TINO | 8 | 2012–2018 |
Locations
| Location | Patents | Span |
|---|---|---|
| Lincoln, NE, US | 85 | 1998–2021 |