LexDanaLexDanabeta
Inventor

Hsiang-Chou Liao

Inventor
Hsinchu, TW

Overview

4→
Patents
2012–2017
Patent span
Physics
Primary field (CPC G)

Patents· 4 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G06Fprimary
G06FElectric digital data processing22%
H01JElectric discharge tubes or discharge lamps22%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1022%
G01RMeasuring electric variables11%
G02BOptical elements, systems or apparatus11%
G11CStatic stores11%
PatentTitleYear
9,589,086'Method for measuring and analyzing surface structure of chip or wafer'20179,244,112'Method for detecting an electrical defect of contact/via plugs'20168,594,963'In-line inspection yield prediction system'20138,329,480'Test pattern for detecting piping in a memory array'2012

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2012–2017Patents assigned to MACRONIX INT CO LTD (4)· patent assignee history
2012–2013Patents assigned to HUNG CHE-LUN (2)· patent assignee history
2012–2013Patents assigned to LIAO HSIANG-CHOU (2)· patent assignee history
2012–2013Patents assigned to LUOH TUUNG (2)· patent assignee history
2012–2013Based in Taipei, TW· patent location history
2013Patents assigned to CHEN KUANG-CHAO (1)· patent assignee history
2016–2017Based in Hsinchu, TW· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
MACRONIX INT CO LTD42012–2017
HUNG CHE-LUN22012–2013
LIAO HSIANG-CHOUself22012–2013
LUOH TUUNG22012–2013
CHEN KUANG-CHAO12013
Locations
LocationPatentsSpan
Hsinchu, TW22016–2017
Taipei, TW22012–2013