Inventor
Motoharu Miyashita
Inventor
Tokyo, JP
Overview
Patents· 18 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H01Sprimary
H01SDevices using the process of light amplification by stimulated emission of radiation [laser] to amplify or generate light38%
B82YSpecific uses or applications of nanostructures23%
B28DWorking stone or stone-like materials5%
C30BSingle-crystal growth5%
H10HInorganic light-emitting semiconductor devices having potential barriers5%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h105%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests5%
Y10TTechnical subjects covered by former us classification5%
B24BMachines, devices, or processes for grinding or polishing3%
G11BInformation storage based on relative movement between record carrier and transducer3%
PatentTitleYear
7,602,830'Monolithic semiconductor laser and method of manufacturing the same'20097,260,132'Semiconductor laser apparatus'20076,414,977'Semiconductor laser device'20026,333,946'Semiconductor laser device and process for manufacturing the same'20016,275,515'Semiconductor laser device and method of producing the same'20015,903,587'Stress compensation type semiconductor laser'19995,887,011'Semiconductor laser'19995,882,952'Semiconductor device including quantum wells or quantum wires and method of making semiconductor device'19995,838,704'Pulsation laser having an active region with a thicker central region in a resonator length direction'19985,835,516'Semiconductor laser device and method of fabricating semiconductor laser device'19985,822,350'Semiconductor laser'19985,805,628'Semiconductor laser'19985,675,601'Semiconductor laser device'19975,673,283'Semiconductor device and fabricating method thereof'19975,477,325'Method for evaluating epitaxial layers and test pattern for process evaluation'19955,439,723'Substrate for producing semiconductor wafer'19955,436,196'Method of producing semiconductor laser'19955,279,077'Method for producing semiconductor wafer'1994Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1994–2009Patents assigned to MITSUBISHI ELECTRIC CORP (18)· patent assignee history
1994–1995Based in Itami, JP· patent location history
1997–2009Based in Tokyo, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| MITSUBISHI ELECTRIC CORP | 18 | 1994–2009 |
Locations
| Location | Patents | Span |
|---|---|---|
| Tokyo, JP | 14 | 1997–2009 |
| Itami, JP | 4 | 1994–1995 |