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Inventor

Albert J. Boehnlein

Inventor
Ypsilanti, MI, US

Overview

4→
Patents
1989–1994
Patent span
Physics
Primary field (CPC G)

Patents· 4 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Bprimary
G01BMeasuring length, thickness or similar linear dimensions67%
G01NInvestigating or analysing materials by determining their chemical or physical properties17%
G06TImage data processing or generation, in general17%
PatentTitleYear
5,367,378'Highlighted panel inspection'19945,307,152'Moire inspection system'19945,069,548'Field shift moire system'19914,880,991'Non-contact dimensional gage for turned parts'1989

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1989–1994Patents assigned to IND TECHNOLOGY INST (4)· patent assignee history
1989–1994Based in Ypsilanti, MI, US· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
IND TECHNOLOGY INST41989–1994
Locations
LocationPatentsSpan
Ypsilanti, MI, US41989–1994