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Inventor

Yin Peng Lv

Inventor
Shanghai, CN

Overview

2→
Patents
2017–2019
Patent span
Physics
Primary field (CPC G)

Patents· 2 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Rprimary
G01RMeasuring electric variables100%
PatentTitleYear
10,345,375Test method and test apparatus for testing a plurality of blocks in a circuit20199,664,741'Test method and test apparatus for testing a plurality of blocks in a circuit'2017

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2017–2019Patents assigned to IBM (2)· patent assignee history
2017–2019Based in Shanghai, CN· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
IBM22017–2019
Locations
LocationPatentsSpan
Shanghai, CN22017–2019