Inventor
Ishai Schwarzband
Inventor
Or-Yehuda, IL
Overview
Patents· 20 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G06Tprimary
G06TImage data processing or generation, in general25%
G01BMeasuring length, thickness or similar linear dimensions12%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices12%
H01JElectric discharge tubes or discharge lamps12%
G01NInvestigating or analysing materials by determining their chemical or physical properties8%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h107%
G01DMeasuring not specially adapted for a specific variable5%
G06KGraphical data reading5%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h105%
G06FElectric digital data processing3%
PatentTitleYear
10,748,272Measuring height difference in patterns on semiconductor wafers202010,731,979Method for monitoring nanometric structures202010,636,140Technique for inspecting semiconductor wafers202010,504,693Evaluating an object201910,354,376Technique for measuring overlay between layers of a multilayer structure201910,103,005Imaging low electron yield regions with a charged beam imager20189,916,652'Technique for measuring overlay between layers of a multilayer structure'20189,858,658'Defect classification using CAD-based context attributes'20189,824,852'CD-SEM technique for wafers fabrication control'20179,715,724'Registration of CAD data with SEM images'20179,674,536'Technique for visualizing elements in images by color coding'20179,595,091'Defect classification using topographical attributes'20179,530,199'Technique for measuring overlay between layers of a multilayer structure'20169,490,101'System and method for scanning an object'20169,378,923'Three-dimensional mapping using scanning electron microscope images'20168,946,627'Three-dimensional mapping using scanning electron microscope images'20158,604,427'Three-dimensional mapping using scanning electron microscope images'20138,213,024'Method and system for aerial imaging of a reticle'20128,098,926'Method and system for evaluating an evaluated pattern of a mask'20127,310,796'System and method for simulating an aerial image'2007Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2007–2020Patents assigned to APPLIED MATERIALS ISRAEL LTD (20)· patent assignee history
2007–2020Based in Or-Yehuda, IL· patent location history
2012–2018Patents assigned to SCHWARZBAND ISHAI (5)· patent assignee history
2012Patents assigned to BRAUDE CHAIM (2)· patent assignee history
2017–2018Patents assigned to KAIZERMAN IDAN (2)· patent assignee history
2017–2018Patents assigned to ROZENMAN EFRAT (2)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| APPLIED MATERIALS ISRAEL LTD | 20 | 2007–2020 |
| SCHWARZBAND ISHAIself | 5 | 2012–2018 |
| BRAUDE CHAIM | 2 | 2012 |
| KAIZERMAN IDAN | 2 | 2017–2018 |
| ROZENMAN EFRAT | 2 | 2017–2018 |
Locations
| Location | Patents | Span |
|---|---|---|
| Or-Yehuda, IL | 20 | 2007–2020 |