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Inventor

Mitsuhiro Oki

Inventor
Kawasaki, JP

Overview

11→
Patents
2012–2020
Patent span
Physics
Primary field (CPC G)

Patents· 11 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties43%
H01JElectric discharge tubes or discharge lamps10%
B23KSoldering or unsoldering5%
B82YSpecific uses or applications of nanostructures5%
C01GCompounds containing metals not covered by subclasses c01d or c01f5%
H01LSemiconductor devices5%
H01MProcesses or means, e.g. batteries, for the direct conversion of chemical energy into electrical energy5%
H10DInorganic electric semiconductor devices5%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h105%
Y02ATechnologies for adaptation to climate change5%
PatentTitleYear
10,761,050Molecular detection apparatus and molecular detection method202010,761,051Molecular detection apparatus and molecular detection method202010,677,770Molecular detection apparatus, molecular detection method, and molecular detector202010,527,581Molecular detection apparatus, molecular detection method, and organic probe20209,859,552'Electrode material for nonaqueous electrolyte secondary battery, electrode for nonaqueous electrolyte secondary battery, and nonaqueous electrolyte secondary battery'20189,709,523'Gas detection apparatus'20179,261,493'Method of quantitative analysis of hexavalent chromium in chromate coating and method for controlling hazardous element in encapsulating resin of resin encapsulation semiconductor device'20168,763,884'Joint with first and second members with a joining layer located therebetween containing Sn metal and another metallic material; methods for forming the same joint'20148,628,600'Method for extracting hexavalent chromium in a polymer material'20148,223,917'Method of quantitative analysis of hexavalent chromium in chromate coating and method for controlling hazardous element in encapsulating resin of resin encapsulation semiconductor device'20128,114,672'Method for analyzing antimony contained in glass'2012

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2012–2020Patents assigned to TOSHIBA KK (11)· patent assignee history
2012–2016Patents assigned to OKI MITSUHIRO (4)· patent assignee history
2012–2016Patents assigned to TAKENAKA MIYUKI (4)· patent assignee history
2012Patents assigned to MORIMOTO SAYAKA (1)· patent assignee history
2012–2020Based in Kawasaki, JP· patent location history
2012–2016Based in Yokohama, JP· patent location history
2014Patents assigned to MURAMATSU MIHO (1)· patent assignee history
2014–2018Based in Kanagawa, JP· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
TOSHIBA KK112012–2020
OKI MITSUHIROself42012–2016
TAKENAKA MIYUKI42012–2016
MORIMOTO SAYAKA12012
MURAMATSU MIHO12014
Locations
LocationPatentsSpan
Kawasaki, JP62012–2020
Yokohama, JP32012–2016
Kanagawa, JP22014–2018