Inventor
Bernd Geck
Inventor
Hannover, DE
Overview
Patents· 6 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables63%
G01DMeasuring not specially adapted for a specific variable25%
G03GElectrography13%
PatentTitleYear
9,470,713'Method of determining scattering parameters using measurement arrangement having a calibration substrate and electronic circuit'20169,116,189'Measuring system for determining scatter parameters'20158,963,570'Contactless loop probe'20158,791,705'Measurement arrangement having a calibration substrate and electronic circuit'20148,760,184'Measuring probe for a vector network analysis system'20147,583,907'Method for adjusting a fusing device of a digital printing machine by determining the humidity of printing material and measuring device to detect the reflectance of microwave signals at a print material'2009Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2009Patents assigned to EASTMAN KODAK CO (1)· patent assignee history
2009–2016Based in Hannover, DE· patent location history
2014–2015Patents assigned to GECK BERND (4)· patent assignee history
2014–2015Patents assigned to ROSENBERGER HOCHFREQUENZTECH (4)· patent assignee history
2014–2015Patents assigned to ZELDER THOMAS (4)· patent assignee history
2016Patents assigned to ROSENBERGER HOCHFREQUENZTECHNIK GMBH & CO KG (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| GECK BERNDself | 4 | 2014–2015 |
| ROSENBERGER HOCHFREQUENZTECH | 4 | 2014–2015 |
| ZELDER THOMAS | 4 | 2014–2015 |
| EASTMAN KODAK CO | 1 | 2009 |
| ROSENBERGER HOCHFREQUENZTECHNIK GMBH & CO KG | 1 | 2016 |
Locations
| Location | Patents | Span |
|---|---|---|
| Hannover, DE | 6 | 2009–2016 |