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Inventor

Biow-Hiem Ong

Inventor
Singapore, SG

Overview

4→
Patents
2014–2017
Patent span
Electricity
Primary field (CPC H)

Patents· 4 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

H10Pprimary
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1033%
G01NInvestigating or analysing materials by determining their chemical or physical properties22%
H01LSemiconductor devices22%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices11%
G06TImage data processing or generation, in general11%
PatentTitleYear
9,689,805'Systems and methods eliminating false defect detections'20179,063,097'Systems and methods eliminating false defect detections'20158,818,072'Rendered database image-to-inspection image optimization for inspection'20148,629,407'Contamination inspection'2014

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2014–2015Patents assigned to CHANG JONG-YUH (3)· patent assignee history
2014–2015Patents assigned to ONG BIOW-HIEM (3)· patent assignee history
2014–2015Patents assigned to TAIWAN SEMICONDUCTOR MFG (3)· patent assignee history
2014–2015Patents assigned to TU CHIH-CHIANG (3)· patent assignee history
2014–2015Patents assigned to LAI CHIEN-HUNG (2)· patent assignee history
2014–2017Based in Singapore, SG· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
CHANG JONG-YUH32014–2015
ONG BIOW-HIEMself32014–2015
TAIWAN SEMICONDUCTOR MFG32014–2015
TU CHIH-CHIANG32014–2015
LAI CHIEN-HUNG22014–2015
Locations
LocationPatentsSpan
Singapore, SG42014–2017