Inventor

Shogo Ishioka

Inventor

Nishikamo-gun, JP

Overview

19→

Patents

2004–2021

Patent span

Physics

Primary field (CPC G)

Patents· 19 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Rprimary

G01RMeasuring electric variables48%

G09GArrangements or circuits for control of indicating devices using static means to present variable information11%

G01BMeasuring length, thickness or similar linear dimensions7%

A01NPreservation of bodies of humans or animals or plants or parts thereof4%

A61FFilters implantable into blood vessels4%

A61LMethods or apparatus for sterilising materials or objects in general4%

B01JChemical or physical processes, e.g. catalysis or colloid chemistry4%

G02FOptical devices or arrangements for the control of light by modification of the optical properties of the media of the elements involved therein4%

G06FElectric digital data processing4%

H05KPrinted circuits4%

PatentTitleYear

11,020,290Material for absorbent article, method for manufacturing same, and absorbent article using same2021 7,332,914'Conductor inspection apparatus and conductor inspection method'2008 7,173,445'Sensor for inspection instrument and inspection instrument'2007 7,138,805'Device and method for inspection'2006 7,088,107'Circuit pattern inspection instrument and pattern inspection method'2006 7,049,826'Inspection device and inspection method'2006 6,995,566'Circuit pattern inspection apparatus, circuit pattern inspection method, and recording medium'2006 6,992,493'Device and method for substrate displacement detection'2006 6,972,573'Device and method for inspecting circuit board'2005 6,958,619'Inspecting apparatus and inspecting method for circuit board'2005 6,952,104'Inspection method and apparatus for testing fine pitch traces'2005 6,943,559'Circuit pattern inspection device, circuit pattern inspection method, and recording medium'2005 6,894,515'Inspection unit and method of manufacturing substrate'2005 6,861,863'Inspection apparatus for conductive patterns of a circuit board, and a holder thereof'2005 6,859,062'Apparatus and method for inspecting a board used in a liquid crystal panel'2005 6,842,026'Inspecting apparatus and inspecting method for circuit board'2005 6,734,692'Inspection apparatus and sensor'2004 6,710,607'Method and apparatus for inspection'2004 6,703,849'Inspection apparatus, inspection method and inspection unit therefor'2004

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2004–2008Patents assigned to OHT INC (18)· patent assignee history

2004–2006Based in Nishikamo-gun, JP· patent location history

2005–2008Based in Hiroshima, JP· patent location history

2021Patents assigned to KAO CORP (1)· patent assignee history

2021Based in Mibu, JP· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees

Assignee	Patents	Span
OHT INC	18	2004–2008
KAO CORP	1	2021

Locations

Location	Patents	Span
Nishikamo-gun, JP	10	2004–2006
Hiroshima, JP	8	2005–2008
Mibu, JP	1	2021