Inventor
Blake W. ERICKSON
Inventor
US
Overview
Patents· 5 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties23%
H01JElectric discharge tubes or discharge lamps23%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1023%
H01LSemiconductor devices15%
G01BMeasuring length, thickness or similar linear dimensions8%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light8%
PatentTitleYear
12,469,686Process characterization and correction using optical wall process sensor (OWPS)202512,442,765Transmission corrected plasma emission using in-situ optical reflectometry202512,080,574Low open area and coupon endpoint detection202412,031,910Transmission corrected plasma emission using in-situ optical reflectometry202412,009,191Thin film, in-situ measurement through transparent crystal and transparent substrate within processing chamber wall2024Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2024–2025Patents assigned to APPLIED MATERIALS INC (5)· patent assignee history
2024–2025Based in US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| APPLIED MATERIALS INC | 5 | 2024–2025 |
Locations
| Location | Patents | Span |
|---|---|---|
| US | 5 | 2024–2025 |