Inventor

Yusuke Yamashita

Inventor

Nagakute-shi, JP

Overview

2008–2020

Patent span

Electricity

Primary field (CPC H)

Patents· 64 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

H01Lprimary

H01LSemiconductor devices23%

H10DInorganic electric semiconductor devices21%

G02BOptical elements, systems or apparatus8%

H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h106%

H04NPictorial communication, e.g. television4%

LOC144%

LOC184%

G01NInvestigating or analysing materials by determining their chemical or physical properties3%

G06KGraphical data reading3%

G06TImage data processing or generation, in general3%

PatentTitleYear

10,873,010Light-emitting device2020 10,845,357Observation system2020 10,840,386Semiconductor apparatus2020 10,791,295Photoelectric conversion apparatus, imaging system, and moving body2020 10,720,492Silicon carbide semiconductor device and manufacturing method therefor2020 10,690,902Image processing device and microscope system2020 10,658,503Diode, semiconductor device, and MOSFET2020 10,638,066Imaging apparatus2020 10,593,750Compound semiconductor device and method for manufacturing the same2020 10,580,851Method for manufacturing compound semiconductor device and compound semiconductor device2020 10,552,945Sample observation apparatus and method for generating observation image of sample2020 10,546,933Switching element and method of manufacturing the same2020 10,538,095Droplet ejecting apparatus2020 D0873342Printer2020 10,466,459Microscope system2019 10,468,520Switching element and method of manufacturing the same2019 D0864289Printer2019 10,439,037Method for manufacturing compound semiconductor device including p-type impurity layer2019 10,417,482Observation system2019 10,263,071Method of manufacturing semiconductor device2019 10,257,430Image processing apparatus for detecting flicker, method of controlling the same, and non-transitory storage medium2019 10,243,035Method of manufacturing switching element2019 10,147,812Diode, semiconductor device, and MOSFET2018 10,141,411Temperature sensing semiconductor device2018 10,121,862Switching device and method of manufacturing the same2018 10,115,956Electricity storage device2018 D0830451Printer2018 D0827022Printer2018 D0825653Waste ink box for printer2018 9,952,461Display device2018 D0809059'Printer'2018 9,871,982'Image pickup apparatus that detects flash band and control method therefor'2018 9,685,512'Semiconductor device'2017 9,679,989'Insulated gate type switching device and method for manufacturing the same'2017 9,666,579'Semiconductor device'2017 9,620,499'Semiconductor device and method of manufacturing the semiconductor device'2017 9,620,632'Semiconductor device and method of manufacturing the semiconductor device'2017 9,595,603'Semiconductor device'2017 9,536,961'Reverse conducting insulated gate bipolar transistor'2017 9,520,487'Reverse conducting insulated gate bipolar transistor'2016 9,520,465'Diode, semiconductor device, and MOSFET'2016 9,508,710'Semiconductor device'2016 9,504,151'Conductive composition and conductive film'2016 D0771184'Combined container and ink tanks for a printer'2016 9,485,373'Printing apparatus'2016 9,437,700'Semiconductor device'2016 9,412,737'IGBT with a built-in-diode'2016 9,366,849'Microscope system and method for microscope system'2016 9,276,137'Diode and semiconductor device including built-in diode'2016 9,159,721'Semiconductor device comprising an diode region and an IGBT region'2015 9,153,576'Semiconductor device'2015 9,099,521'Reverse conducting IGBT'2015 8,913,819'Observation apparatus and observation method'2014 8,699,128'Laser scanning microscope'2014 8,550,510'Vehicle bumper'2013 D0670327'Printer'2012 D0665013'Printer'2012 D0649183'Printer'2011 D0643462'Printer'2011 7,982,170'Microscope system'2011 7,724,426'Laser scanning microscope and microscopic observing method'2010 7,709,773'Scanning optical device which sets hardware in association with a depth of a focus position based on hardware set values stored in association with depths of focus positions'2010 7,696,996'Laser scanning microscope apparatus'2010 7,355,702'Confocal observation system'2008

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2008–2020Patents assigned to OLYMPUS CORP (13)· patent assignee history

2008–2020Based in Tokyo, JP· patent location history

2011–2020Patents assigned to SEIKO EPSON CORP (13)· patent assignee history

2011–2016Patents assigned to YAMASHITA YUSUKE (12)· patent assignee history

2011–2020Based in Matsumoto, JP· patent location history

2015–2020Patents assigned to TOYOTA MOTOR CO LTD (26)· patent assignee history

2015–2020Based in Nagoya, JP· patent location history

2016–2020Based in Nagakute-shi, JP· patent location history

2018–2020Patents assigned to DENSO CORP (7)· patent assignee history

2018–2020Based in Kawasaki, JP· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees

Assignee	Patents	Span
TOYOTA MOTOR CO LTD	26	2015–2020
OLYMPUS CORP	13	2008–2020
SEIKO EPSON CORP	13	2011–2020
YAMASHITA YUSUKEself	12	2011–2016
DENSO CORP	7	2018–2020

Locations

Location	Patents	Span
Nagakute-shi, JP	19	2016–2020
Matsumoto, JP	12	2011–2020
Tokyo, JP	10	2008–2020
Nagoya, JP	10	2015–2020
Kawasaki, JP	4	2018–2020