Inventor
Masamichi Oi
Inventor
Chiba, JP
Overview
Patents· 9 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H01Jprimary
H01JElectric discharge tubes or discharge lamps53%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1013%
G01BMeasuring length, thickness or similar linear dimensions7%
G01NInvestigating or analysing materials by determining their chemical or physical properties7%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices7%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h107%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests7%
PatentTitleYear
7,339,383'Nanogripper device having length measuring function and method for length measurement executed with nanogripper device having length measuring function'20087,154,106'Composite system of scanning electron microscope and focused ion beam'20067,060,397'EPL mask processing method and device thereof'20066,934,920'Specimen analyzing method'20056,825,468'Fine stencil structure correction device'20046,486,471'Composite charge particle beam apparatus'20026,472,881'Liquid metal ion source and method for measuring flow impedance of liquid metal ion source'20026,452,173'Charged particle apparatus'20026,452,172'Composite charged particle beam apparatus'2002Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2002Patents assigned to SEIKO INSTR INC (4)· patent assignee history
2002–2008Based in Chiba, JP· patent location history
2004–2008Patents assigned to SII NANOTECHNOLOGY INC (5)· patent assignee history
2008Patents assigned to AOI ELECTRONICS CO LTD (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| SII NANOTECHNOLOGY INC | 5 | 2004–2008 |
| SEIKO INSTR INC | 4 | 2002 |
| AOI ELECTRONICS CO LTD | 1 | 2008 |
Locations
| Location | Patents | Span |
|---|---|---|
| Chiba, JP | 9 | 2002–2008 |