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Inventor

Yasushi Sugiyama

Inventor
Hitachinaka, JP

Overview

17→
Patents
1994–2021
Patent span
Physics
Primary field (CPC G)

Patents· 17 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G06Fprimary
G06FElectric digital data processing7%
B24BMachines, devices, or processes for grinding or polishing5%
B60RVehicles, vehicle fittings, or vehicle parts, not otherwise provided for5%
F02DControlling combustion engines5%
G01LMeasuring force, stress, torque, work, mechanical power, mechanical efficiency, or fluid pressure5%
G06QInformation and communication technology [ict] specially adapted for administrative, commercial, financial, managerial or supervisory purposes5%
G07CTime or attendance registers5%
H02JElectric power networks5%
H02MApparatus for conversion between ac and ac, between ac and dc, or between dc and dc, and for use with mains or similar power supply systems5%
Y02TClimate change mitigation technologies related to transportation5%
PatentTitleYear
11,008,988Electronic control device and abnormality/normality determination method of electronic control device202110,394,180Cleaning blade201910,340,833Load drive device201910,340,799Step-up/down power supply and power supply circuit201910,192,248Server device, information device, power outlet, charging information generating method, and charging information generating program201910,002,699Electromagnetic coil driving control device20189,783,138'Vehicle control device'20179,741,190'Public service management method, public service management apparatus, and public service management programs for properly providing public services'20179,600,047'Electronic control unit'20179,126,495'Electronic control unit for automobile'20157,789,210'Sealing device'20107,667,455'Annular magnetic encoder having pole arrangement that specifies rotational angle'20106,551,172'Polishing apparatus and polishing method'20036,142,855'Polishing apparatus and polishing method'20006,137,575'Film thickness measuring method and apparatus'20005,791,035'Method for making a sensor element'19985,357,814'Method of detecting engagement/disengagement characteristic of connector and apparatus therefor'1994

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1998–2019Patents assigned to NOK CORP (4)· patent assignee history
1998–2019Based in Kanagawa, JP· patent location history
2000–2003Patents assigned to CANON KK (3)· patent assignee history
2000–2003Based in Minami, JP· patent location history
2010Based in Fujisawa, JP· patent location history
2015–2021Patents assigned to HITACHI AUTOMOTIVE SYSTEMS LTD (7)· patent assignee history
2015Patents assigned to KADOYA KIYOOMI (1)· patent assignee history
2015Patents assigned to MAYUZUMI TAKUYA (1)· patent assignee history
2015–2021Based in Hitachinaka, JP· patent location history
2017–2019Based in Tokyo, JP· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
HITACHI AUTOMOTIVE SYSTEMS LTD72015–2021
NOK CORP41998–2019
CANON KK32000–2003
KADOYA KIYOOMI12015
MAYUZUMI TAKUYA12015
Locations
LocationPatentsSpan
Hitachinaka, JP62015–2021
Kanagawa, JP21998–2019
Tokyo, JP22017–2019
Fujisawa, JP22010
Minami, JP22000–2003