Inventor
Benjamin J. Pernick
Inventor
Forest Hills, NY, US
Overview
Patents· 24 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G02Bprimary
G02BOptical elements, systems or apparatus24%
G06EOptical computing devices17%
G06VImage or video recognition or understanding13%
G01NInvestigating or analysing materials by determining their chemical or physical properties9%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests9%
G01BMeasuring length, thickness or similar linear dimensions4%
A61FFilters implantable into blood vessels2%
B64DEquipment for fitting in or to aircraft2%
B64FGround or aircraft-carrier-deck installations specially adapted for use in connection with aircraft2%
E04CStructural elements2%
PatentTitleYear
5,921,501'Aircraft ice detecting system'19995,671,090'Methods and systems for analyzing data'19975,490,011'Modular enclosure assembly'19965,477,382'Optical correlator system'19955,363,233'Optical correlator using fiber optics lasers'19945,253,834'Alignment fixture for unobstructed pivot point'19935,227,859'Passive coherent radiation detection system'19935,221,977'Laser radiation protection system'19935,129,041'Optical neural network processing element with multiple holographic element interconnects'19925,107,351'Image enhanced optical correlator system'19925,103,082'Automatic laser beam expander-pinhole alignment system'19925,008,851'Optical heterodyning system and method for rapid optical phase and amplitude measurements'19914,998,787'Method of fabricating a multiple holographic lens'19914,950,050'Optical target recognition system'19904,936,655'Alignment fixture for an optical instrument'19904,932,741'Optical correlator system'19904,892,408'Reference input patterns for evaluation and alignment of an optical matched filter correlator'19904,810,047'In-line holographic lens arrangement'19894,544,898'Signal device employing photorefractive area modulation'19854,471,445'Fourier transform signal processor'19844,465,371'Optical flaw detection method and apparatus'19844,334,780'Optical surface roughness detection method and apparatus'19824,213,036'Method for classifying biological cells'19804,150,360'Method and apparatus for classifying biological cells'1979Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1979–1993Patents assigned to GRUMMAN AEROSPACE CORP (19)· patent assignee history
1979–1980Based in Brooklyn, NY, US· patent location history
1982–1990Based in Hampton Bays, NY, US· patent location history
1989–1999Based in Forest Hills, NY, US· patent location history
1990Based in New York, NY, US· patent location history
1994Patents assigned to PERNICK BENJAMIN J (1)· patent assignee history
1995–1999Patents assigned to NORTHROP GRUMMAN CORP (4)· patent assignee history
1997Based in Forrest Hills, NY, US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| GRUMMAN AEROSPACE CORP | 19 | 1979–1993 |
| NORTHROP GRUMMAN CORP | 4 | 1995–1999 |
| PERNICK BENJAMIN Jself | 1 | 1994 |
Locations
| Location | Patents | Span |
|---|---|---|
| Forest Hills, New York, US | 15 | 1989–1999 |
| Hampton Bays, New York, US | 5 | 1982–1990 |
| Brooklyn, New York, US | 2 | 1979–1980 |
| Forrest Hills, New York, US | 1 | 1997 |
| New York, New York, US | 1 | 1990 |