Inventor
Hiroshi Sasai
Inventor
Tokyo, JP
Overview
Patents· 13 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties26%
B08BCleaning in general15%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1015%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests15%
B66BElevators7%
H01FMagnets7%
D01HSpinning or twisting4%
D07BRopes or cables in general4%
G01BMeasuring length, thickness or similar linear dimensions4%
H01RElectrically-conductive connections4%
PatentTitleYear
11,099,138Detection device20218,536,861'Wire rope flaw detector'20138,476,898'Rope tester detection plate'20138,390,281'Wire rope flaw detector for increasing accuracy independent of speed while conserving detector size'20138,164,329'Wire rope flaw detector'20127,982,458'Wire-rope flaw detector'20116,926,558'Modular jack'20056,690,024'Laser inspection apparatus'20046,215,386'Coil device'20015,590,672'Semiconductor cleaning apparatus and wafer cassette'19975,568,821'Semiconductor cleaning apparatus and wafer cassette'19965,551,459'Semiconductor cleaning apparatus and wafer cassette'19965,445,171'Semiconductor cleaning apparatus and wafer cassette'1995Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1995–2021Patents assigned to MITSUBISHI ELECTRIC CORP (11)· patent assignee history
1995–1997Based in Itami, JP· patent location history
2001–2021Based in Tokyo, JP· patent location history
2012–2013Patents assigned to SASAI HIROSHI (4)· patent assignee history
2012–2013Patents assigned to YOSHIOKA TAKASHI (4)· patent assignee history
2012–2013Patents assigned to FURUSAWA KIMIYASU (2)· patent assignee history
2013Patents assigned to NISHIYORI KOICHIRO (2)· patent assignee history
2013Based in Chiyoda-ku, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| MITSUBISHI ELECTRIC CORP | 11 | 1995–2021 |
| SASAI HIROSHIself | 4 | 2012–2013 |
| YOSHIOKA TAKASHI | 4 | 2012–2013 |
| FURUSAWA KIMIYASU | 2 | 2012–2013 |
| NISHIYORI KOICHIRO | 2 | 2013 |
Locations
| Location | Patents | Span |
|---|---|---|
| Tokyo, JP | 8 | 2001–2021 |
| Itami, JP | 4 | 1995–1997 |
| Chiyoda-ku, JP | 1 | 2013 |