Inventor
Justin Dianhuan Liou
Inventor
Santa Clara, CA, US
Overview
Patents· 13 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H01Sprimary
H01SDevices using the process of light amplification by stimulated emission of radiation [laser] to amplify or generate light22%
G01NInvestigating or analysing materials by determining their chemical or physical properties18%
G02BOptical elements, systems or apparatus16%
G02FOptical devices or arrangements for the control of light by modification of the optical properties of the media of the elements involved therein8%
A61MDevices for introducing media into, or onto, the body4%
B01DSeparation4%
C23CCoating metallic material4%
F16KValves4%
F17CVessels for containing or storing compressed, liquefied or solidified gases4%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices4%
PatentTitleYear
10,439,355193nm laser and inspection system201910,193,293Semiconductor inspection and metrology system using laser pulse multiplier201910,044,164Laser repetition rate multiplier and flat-top beam profile generators using mirrors and/or prisms201810,032,619High brightness laser-sustained plasma broadband source20189,972,959Semiconductor inspection and metrology system using laser pulse multiplier20189,935,421193nm laser and inspection system20189,865,447'High brightness laser-sustained plasma broadband source'20189,793,673'Semiconductor inspection and metrology system using laser pulse multiplier'20179,768,577'Semiconductor inspection and metrology system using laser pulse multiplier'20179,608,399'193 nm laser and an inspection system using a 193 nm laser'20179,529,182'193nm laser and inspection system'20169,525,265'Laser repetition rate multiplier and flat-top beam profile generators using mirrors and/or prisms'20169,151,940'Semiconductor inspection and metrology system using laser pulse multiplier'2015Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2015–2019Patents assigned to KLA TENCOR CORP (13)· patent assignee history
2015–2019Based in Santa Clara, CA, US· patent location history
2017Patents assigned to ARMSTRONG J JOSEPH (1)· patent assignee history
2017Patents assigned to BROWN DAVID L (1)· patent assignee history
2017Patents assigned to CHUANG YUNG-HO (1)· patent assignee history
2017Patents assigned to DRIBINSKI VLADIMIR (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| KLA TENCOR CORP | 13 | 2015–2019 |
| ARMSTRONG J JOSEPH | 1 | 2017 |
| BROWN DAVID L | 1 | 2017 |
| CHUANG YUNG-HO | 1 | 2017 |
| DRIBINSKI VLADIMIR | 1 | 2017 |
Locations
| Location | Patents | Span |
|---|---|---|
| Santa Clara, California, US | 13 | 2015–2019 |