Inventor
Hirohisa Amago
Inventor
Kanagawa, JP
Overview
Patents· 3 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties29%
H10DInorganic electric semiconductor devices29%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1029%
H05KPrinted circuits14%
PatentTitleYear
8,404,498'Method of inspecting semiconductor thin film by transmission imaging and inspection device for the same'20138,193,008'Method of forming semiconductor thin film and semiconductor thin film inspection apparatus'20125,402,314'Printed circuit board having through-hole stopped with photo-curable solder resist'1995Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1995–2013Patents assigned to SONY CORP (3)· patent assignee history
1995–2013Based in Kanagawa, JP· patent location history
2012–2013Patents assigned to AMAGO HIROHISA (2)· patent assignee history
2012–2013Patents assigned to UMEZU NOBUHIKO (2)· patent assignee history
2012Patents assigned to MATSUNOBU GO (1)· patent assignee history
2012Patents assigned to SHIRAI KATSUYA (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| SONY CORP | 3 | 1995–2013 |
| AMAGO HIROHISAself | 2 | 2012–2013 |
| UMEZU NOBUHIKO | 2 | 2012–2013 |
| MATSUNOBU GO | 1 | 2012 |
| SHIRAI KATSUYA | 1 | 2012 |
Locations
| Location | Patents | Span |
|---|---|---|
| Kanagawa, JP | 3 | 1995–2013 |