Inventor
SHINJI UEYAMA
Inventor
JP
Overview
Patents· 7 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables16%
G01NInvestigating or analysing materials by determining their chemical or physical properties11%
H01LSemiconductor devices11%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1011%
B65GTransport or storage devices, e.g. conveyors for loading or tipping, shop conveyor systems or pneumatic tube conveyors5%
G01BMeasuring length, thickness or similar linear dimensions5%
G02BOptical elements, systems or apparatus5%
G06TImage data processing or generation, in general5%
G11CStatic stores5%
H01FMagnets5%
PatentTitleYear
12,560,792Polarized microscope and intra image field correction analysis method202612,535,315Optical device and optical measurement method202612,500,107Mounting device and mounting method202512,439,607Inspection device202512,327,579Inspection device202512,051,604Apparatus for manufacturing semiconductor device and method of manufacturing semiconductor device202411,796,608Magnetic property measurement apparatus2023Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2023–2026Patents assigned to SAMSUNG ELECTRONICS CO LTD (7)· patent assignee history
2023–2026Based in JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| SAMSUNG ELECTRONICS CO LTD | 7 | 2023–2026 |
Locations
| Location | Patents | Span |
|---|---|---|
| JP | 7 | 2023–2026 |