Inventor
John Dunklee
Inventor
Tigard, OR, US
Overview
Patents· 48 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables52%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1022%
Y10TTechnical subjects covered by former us classification12%
H10NElectric solid-state devices not otherwise provided for7%
B23QDetails, components, or accessories for machine tools, e.g. arrangements for copying or controlling2%
LOC132%
B01LChemical or physical laboratory apparatus for general use1%
G01NInvestigating or analysing materials by determining their chemical or physical properties1%
PatentTitleYear
10,620,262Modular rail systems, rail systems, mechanisms, and equipment for devices under test202010,295,565Probe card with stress relieving feature201910,261,124Modular rail systems, rail systems, mechanisms, and equipment for devices under test201910,254,311Probe card with stress relieving feature201910,254,309Test apparatus having a probe core with a latch mechanism201910,145,863Test systems with a probe apparatus and index mechanism20189,726,694'Test systems with a probe apparatus and index mechanism'20179,024,651'Test apparatus having a probe card and connector mechanism'20159,018,966'Test apparatus having a probe card and connector mechanism'20158,994,390'Test systems with a probe apparatus and index mechanism'2015D0722031'Top contact layout board in an electrical system'2015D0713363'Support for a probe test core'20147,969,173'Chuck for holding a device under test'20117,876,115'Chuck for holding a device under test'20117,688,062'Probe station'20107,688,091'Chuck with integrated wafer support'20107,639,003'Guarded tub enclosure'20097,618,590'Fluid dispensing system'20097,616,017'Probe station thermal chuck with shielding for capacitive current'20097,554,322'Probe station'20097,518,358'Chuck for holding a device under test'20097,518,387'Shielded probe for testing a device under test'20097,514,915'Chuck for holding a device under test'20097,501,810'Chuck for holding a device under test'20097,498,828'Probe station with low inductance path'20097,492,172'Chuck for holding a device under test'20097,489,149'Shielded probe for testing a device under test'20097,482,823'Shielded probe for testing a device under test'20097,468,609'Switched suspended conductor and connection'20087,436,194'Shielded probe with low contact resistance for testing a device under test'20087,423,419'Chuck for holding a device under test'20087,362,115'Chuck with integrated wafer support'20087,352,168'Chuck for holding a device under test'20087,304,488'Shielded probe for high-frequency testing of a device under test'20077,292,057'Probe station thermal chuck with shielding for capacitive current'20077,250,779'Probe station with low inductance path'20077,221,172'Switched suspended conductor and connection'20077,221,146'Guarded tub enclosure'20077,187,188'Chuck with integrated wafer support'20077,161,363'Probe for testing a device under test'20077,138,813'Probe station thermal chuck with shielding for capacitive current'20066,965,226'Chuck for holding a device under test'20056,914,423'Probe station'20056,861,856'Guarded tub enclosure'20056,815,963'Probe for testing a device under test'20046,642,732'Probe station thermal chuck with shielding for capacitive current'20036,512,391'Probe station thermal chuck with shielding for capacitive current'20036,445,202'Probe station thermal chuck with shielding for capacitive current'2002Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2002–2011Patents assigned to CASCADE MICROTECH INC (36)· patent assignee history
2002–2020Based in Tigard, OR, US· patent location history
2014–2020Patents assigned to CELADON SYSTEMS INC (11)· patent assignee history
2015Patents assigned to DUNKLEE JOHN L (3)· patent assignee history
2015Patents assigned to FUNK WILLIAM A (3)· patent assignee history
2015Patents assigned to ROOT BRYAN J (3)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| CASCADE MICROTECH INC | 36 | 2002–2011 |
| CELADON SYSTEMS INC | 11 | 2014–2020 |
| DUNKLEE JOHN Lself | 3 | 2015 |
| FUNK WILLIAM A | 3 | 2015 |
| ROOT BRYAN J | 3 | 2015 |
Locations
| Location | Patents | Span |
|---|---|---|
| Tigard, OR, US | 48 | 2002–2020 |