Inventor
Shinji Omori
Inventor
Kanagawa, JP
Overview
Patents· 22 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties17%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices17%
H01JElectric discharge tubes or discharge lamps16%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests12%
B82YSpecific uses or applications of nanostructures10%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1010%
B03CMagnetic or electrostatic separation of solid materials from solid materials or fluids3%
G01RMeasuring electric variables3%
B01LChemical or physical laboratory apparatus for general use2%
C12MApparatus for enzymology or microbiology2%
PatentTitleYear
10,962,495Blood coagulation system analysis system, blood coagulation system analysis method, and blood coagulation system analysis program202110,794,896Blood coagulation system examination module, blood coagulation system examination system, blood coagulation system examination method, and determination method of parameter for blood coagulation system examination module202010,222,314Flow channel device, complex permittivity measuring apparatus, and dielectric cytometry system20199,915,599'Microparticle analysis apparatus and microparticle analysis system'20189,250,296'Transmission line for dielectric measurement and dielectric measuring device having the transmission line'20168,999,243'Blood coagulation system analyzing method and blood coagulation system analyzing device'20158,828,212'Dielectric cytometric apparatus and dielectric-cytometric cell sorting method'20148,735,163'Blood coagulation system analyzing method and blood coagulation system analyzing device'20148,368,410'Transmission line for dielectric measurement and dielectric measuring device having the transmission line'20138,197,655'System and method for detecting interaction between substances by superimposingly applying sinusoidal voltage'20127,556,895'Mask, method of producing mask, and method of producing semiconductor device'20097,456,031'Exposure device, exposure method, and semiconductor device manufacturing method'20087,247,410'Complementary division mask, method of producing mask, and program'20077,175,952'Method of generating mask distortion data, exposure method and method of producing semiconductor device'20077,144,178'Mask, method of producing mask, and method of producing semiconductor device'20067,109,500'Mask pattern correction method, semiconductor device manufacturing method, mask manufacturing method and mask'20067,060,996'Mask, method of producing mask, and method of producing semiconductor device'20067,057,300'Mask, method of producing mask, and method of producing semiconductor device'20066,955,993'Mask and method for making the same, and method for making semiconductor device'20056,787,785'Mask and production method therefor and production method for semiconductor device'20045,675,363'Method and equipment for controlling display of image data according to random-scan system'19974,644,582'Image registration method'1987Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1987Based in Kodaira, JP· patent location history
1997Based in Akishima, JP· patent location history
2004–2021Patents assigned to SONY CORP (20)· patent assignee history
2004–2009Based in Kanagawa, JP· patent location history
2012–2019Patents assigned to OMORI SHINJI (5)· patent assignee history
2012–2019Based in Tokyo, JP· patent location history
2013–2014Patents assigned to HAYASHI YOSHIHITO (2)· patent assignee history
2014–2019Patents assigned to KATSUMOTO YOICHI (3)· patent assignee history
2014Patents assigned to SATO KAZUMASA (2)· patent assignee history
2018–2021Based in Chiba, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| SONY CORP | 20 | 2004–2021 |
| OMORI SHINJIself | 5 | 2012–2019 |
| KATSUMOTO YOICHI | 3 | 2014–2019 |
| HAYASHI YOSHIHITO | 2 | 2013–2014 |
| SATO KAZUMASA | 2 | 2014 |
Locations
| Location | Patents | Span |
|---|---|---|
| Kanagawa, JP | 10 | 2004–2009 |
| Tokyo, JP | 7 | 2012–2019 |
| Chiba, JP | 3 | 2018–2021 |
| Akishima, JP | 1 | 1997 |
| Kodaira, JP | 1 | 1987 |