Inventor
Zheng-Yang Pan
Inventor
Zhubei City, TW
Overview
Patents· 23 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H01Lprimary
H01LSemiconductor devices33%
H10DInorganic electric semiconductor devices31%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1021%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h109%
C07KPeptides1%
C12NMicroorganisms or enzymes1%
C40BCombinatorial chemistry1%
G01NInvestigating or analysing materials by determining their chemical or physical properties1%
PatentTitleYear
11,011,433NMOS and PMOS transistor gates with hafnium oxide layers and lanthanum oxide layers202110,879,124Method to form a fully strained channel region202010,875,905Peptide-MHC compacts202010,879,240Fin field effect transistor (FinFET) device structure202010,879,126Semiconductor device and method202010,879,396Semiconductor device with source/drain structures202010,867,799FinFET device and methods of forming same202010,734,524Semiconductor device with multi-layered source/drain regions having different dopant concentrations and manufacturing method thereof202010,672,886Structure and method for high-k metal gate202010,636,909Formation method of semiconductor device with source/drain structures202010,629,496Methods for forming transistor gates with hafnium oxide layers and lanthanum oxide layers202010,535,736Fully strained channel202010,522,358FinFET device and methods of forming same201910,490,661Dopant concentration boost in epitaxially formed material201910,347,764Semiconductor device with multi-layered source/drain regions having different dopant concentrations and manufacturing method thereof201910,269,646Semiconductor device and method201910,164,100Formation method and structure semiconductor device with source/drain structures201810,043,665Formation method of semiconductor device structure with semiconductor nanowire201810,026,840Structure of semiconductor device with source/drain structures20189,917,189'Method for detecting presence and location of defects in a substrate'20189,899,273'Semiconductor structure with dopants diffuse protection and method for forming the same'20189,847,334Structure and formation method of semiconductor device with channel layer20179,721,826'Wafer supporting structure, and device and method for manufacturing semiconductor'2017Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2017–2021Patents assigned to TAIWAN SEMICONDUCTOR MFG CO LTD (22)· patent assignee history
2017–2021Based in Zhubei City, TW· patent location history
2017Based in Hsinchu County, TW· patent location history
2018Based in Hsinchu, TW· patent location history
2020Patents assigned to PACT PHARMA INC (1)· patent assignee history
2020Based in Freemont, CA, US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| TAIWAN SEMICONDUCTOR MFG CO LTD | 22 | 2017–2021 |
| PACT PHARMA INC | 1 | 2020 |
Locations
| Location | Patents | Span |
|---|---|---|
| Zhubei City, TW | 20 | 2017–2021 |
| Freemont, California, US | 1 | 2020 |
| Hsinchu, TW | 1 | 2018 |
| Hsinchu County, TW | 1 | 2017 |