Inventor
Jerry D. McBride
Inventor
Boise, ID, US
Overview
Patents· 7 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables50%
G11CStatic stores43%
Y10TTechnical subjects covered by former us classification7%
PatentTitleYear
7,459,923'Probe interposers and methods of fabricating probe interposers'20087,194,667'System for storing device test information on a semiconductor device using on-device logic for determination of test results'20077,168,018'Apparatus and method for reducing test resources in testing DRAMs'20076,986,084'Apparatus and method for reducing test resources in testing DRAMS'20066,854,079'Apparatus and method for reducing test resources in testing Rambus DRAMs'20056,829,737'Method and system for storing device test information on a semiconductor device using on-device logic for determination of test results'20046,530,045'Apparatus and method for testing rambus DRAMs'2003Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2003–2008Patents assigned to MICRON TECHNOLOGY INC (7)· patent assignee history
2003–2008Based in Boise, ID, US· patent location history
2006Based in Biose, ID, US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| MICRON TECHNOLOGY INC | 7 | 2003–2008 |
Locations
| Location | Patents | Span |
|---|---|---|
| Boise, ID, US | 6 | 2003–2008 |
| Biose, ID, US | 1 | 2006 |