Inventor
Satoko Nakajima
Inventor
Kyoto, JP
Overview
Patents· 1 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
A61Bprimary
A61BDiagnosis33%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light33%
G01NInvestigating or analysing materials by determining their chemical or physical properties33%
PatentTitleYear
4,773,097'Image analyzing apparatus'1988Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1988Patents assigned to OMRON TATEISI ELECTRONICS CO (1)· patent assignee history
1988Based in Kyoto, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| OMRON TATEISI ELECTRONICS CO | 1 | 1988 |
Locations
| Location | Patents | Span |
|---|---|---|
| Kyoto, JP | 1 | 1988 |