Inventor
Chang Soo Jang
Inventor
Goyang-si, KR
Overview
Patents· 20 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H10Dprimary
H10DInorganic electric semiconductor devices12%
H05KPrinted circuits10%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1010%
G01RMeasuring electric variables9%
G02FOptical devices or arrangements for the control of light by modification of the optical properties of the media of the elements involved therein9%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h109%
G09FDisplaying7%
H01GCapacitors7%
H01LSemiconductor devices5%
Y10TTechnical subjects covered by former us classification5%
PatentTitleYear
10,867,752Capacitor and method of manufacturing the same202010,811,193Capacitor component202010,755,855Capacitor and method of manufacturing the same202010,699,845Capacitor component and method of manufacturing the same20209,618,781'Display device and method of manufacturing the same'20179,482,900'Display device'20169,304,245'Display device including a light guide bonded to a display panel'20169,282,666'Display device and method of manufacturing the same'20169,256,093'Display apparatus and method for manufacturing the same'20168,108,185'Electrostatic discharge voltage resistive current modeling method of electrostatic discharge protection device'20127,898,269'Semiconductor device and method for measuring analog channel resistance thereof'20117,811,626'Printed circuit board and method of manufacturing the same'20107,804,693'Printed circuit board having structure for relieving stress concentration, and semiconductor chip package equipped with the same'20107,615,991'Method for measuring analog channel resistance of a semiconductor device having a gate, a source, a drain, a drain sense and a source sense'20097,489,157'System and method for automatically measuring carrier density distribution by using capacitance-voltage characteristics of a MOS transistor device'20097,470,461'Printed circuit board and method of manufacturing the same'20087,315,174'Method of measuring flat-band status capacitance of a gate oxide in a MOS transistor device'20087,312,606'Method for automatic measurement of failure in subthreshold region of metal-oxide-semiconductor transistor'20077,292,138'Vehicle tire with RFID tag'20077,199,462'Substrate for producing semiconductor packages'2007Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2007–2010Patents assigned to SAMSUNG TECHWIN CO LTD (5)· patent assignee history
2007–2009Patents assigned to DONGBU ELECTRONICS CO LTD (3)· patent assignee history
2007–2010Based in Yongin-si, KR· patent location history
2007Based in Gwanak-gu, KR· patent location history
2008–2012Based in Seoul, KR· patent location history
2009–2012Patents assigned to DONGBU HITEK CO LTD (3)· patent assignee history
2016–2017Patents assigned to LG DISPLAY CO LTD (5)· patent assignee history
2016–2017Based in Goyang-si, KR· patent location history
2020Patents assigned to SAMSUNG ELECTRO MECH (4)· patent assignee history
2020Based in Suwon-si, KR· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| LG DISPLAY CO LTD | 5 | 2016–2017 |
| SAMSUNG TECHWIN CO LTD | 5 | 2007–2010 |
| SAMSUNG ELECTRO MECH | 4 | 2020 |
| DONGBU ELECTRONICS CO LTD | 3 | 2007–2009 |
| DONGBU HITEK CO LTD | 3 | 2009–2012 |
Locations
| Location | Patents | Span |
|---|---|---|
| Goyang-si, KR | 5 | 2016–2017 |
| Seoul, KR | 5 | 2008–2012 |
| Yongin-si, KR | 5 | 2007–2010 |
| Suwon-si, KR | 4 | 2020 |
| Gwanak-gu, KR | 1 | 2007 |